Magnetism at Surfaces and Spin Polarized Electron Spectroscopy

  • H. C. Siegmann
Part of the NATO ASI Series book series (NSSB, volume 163)


Magnetic properties are often very different at the surface compared to the bulk. The inherent breaking of the symmetry at the surface, compositional and structural changes as well as surface adsorbates are possible causes of surface induced magnetic changes. The complex phenomena associated with magnetism at surfaces pose a great challenge to the experimentalist and require new techniques of measurement.


Domain Wall Remanent Magnetization Spin Polarization Magnetization Curve Exchange Coupling 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    U. Gradmann, J. Mag. and Mag. Mat. 54–57:733 (1986)Google Scholar
  2. 2.
    J.G. Gay and R. Richter, Phys. Rev. Lett. 56:2728 (1986)ADSCrossRefGoogle Scholar
  3. 3.
    H. Zijlstra, IEEE Trans. on Mag., Vol. Mag. 15:1246 (1979)ADSCrossRefGoogle Scholar
  4. 4.
    D. Weiler, S.F. Alvarado, W. Goudat, K. Schröder and M. Campagna, Phys. Rev. Lett. 54:1555 (1985)ADSCrossRefGoogle Scholar
  5. 5.
    D. Mauri, H.C. Siegmann, P.S. Bagus and E. Kay, to be publishedGoogle Scholar
  6. 6.
    G.L. Bona, F. Meier, M. Taborelli, H.C. Siegmann, A.E. Bell, R.J. Gambino and E. Kay, J. Mag. and Mag. Mat. 54–57:1403 (1986)Google Scholar
  7. 7.
    L. Schlapbach, J. of the Less Common Met. III:291 (1985)CrossRefGoogle Scholar
  8. 8.
    G.A.N. Conell, R. Allen and M. Mansuripur, J. Appl. Phys. 53:7759 (1982)ADSCrossRefGoogle Scholar
  9. 9.
    H.C. Siegmann, P.S. Bagus and E. Kay, to be publ.Google Scholar
  10. 10.
    For a review see H.C. Siegmann, F. Meier, M. Erbudak and M. Landolt, Adv. El. and El. Phys. 62:1 (1984)CrossRefGoogle Scholar
  11. 11.
    D. Mauri, R. Allenspach and M. Landolt, J. Appl. Phys. 58:906 (1985)ADSCrossRefGoogle Scholar
  12. 12.
    J.P. Ganachaud and M. Cailler, Surf. Sci. 83:519 (1979)ADSCrossRefGoogle Scholar
  13. 13.
    R. Allenspach, M. Taborelli, M. Landolt and H.C. Siegmann, Phys. Rev. Lett. 56:953 (1986)ADSCrossRefGoogle Scholar
  14. 14.
    B.T. Jonker, K.H. Walker, E. Kisker, G.A. Prinz and C. Carbone, Phys. Rev. Lett. 57:142 (1986)ADSCrossRefGoogle Scholar
  15. 15.
    E.C. Stoner and E.P. Wohlfarth, Phil. Trans. Roy. Soc. (London) A240:599 (1948)ADSGoogle Scholar
  16. 16.
    D. Pescia, G. Zampieri, M. Stampanoni, G.L. Bona, R.F. Willis and F. Meier, to be publ.Google Scholar
  17. 17.
    E. Kisker, K. Schroeder, W. Goudat and M. Campagna, Phys. Rev. B31:329 (1985), and ref. citedADSGoogle Scholar
  18. 18.
    M. Taborelli and R. Allenspach, priv. comm.Google Scholar
  19. 19.
    E. Kay, R.A. Sigsbee, G.L. Bona, M. Taborelli and H.C. Siegmann, Appl. Phys. Lett. 47:533 (1985)ADSCrossRefGoogle Scholar
  20. 20.
    S. Esho, Suppl. Japan J. Appl. Phys. 15:93 (1976)Google Scholar
  21. 21.
    M. Taborelli, R. Allenspach, G. Boffa and M. Landolt, Phys. Rev. Lett. 56:2869 (1986)ADSCrossRefGoogle Scholar
  22. 22.
    M. Aeschlimann, Diploma ETH Zurich 1985, unpubl.Google Scholar

Copyright information

© Springer Science+Business Media New York 1987

Authors and Affiliations

  • H. C. Siegmann
    • 1
  1. 1.Swiss Federal Institute of TechnologyZürichSwitzerland

Personalised recommendations