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The Characterization of Modulated Metallic Structures by X-Ray Diffraction

  • Roy Clarke
Part of the NATO ASI Series book series (NSSB, volume 163)

Abstract

Artificial heterostructures provide fascinating examples of solid state systems in which structure and composition can be controlled on an atomic scale in order to achieve extraordinary physical properties [1,2]. This microscopic control of physical properties, for long a dream of solid state physicists and materials scientists, is made possible by recent progress in thin film deposition techniques and new methods for their characterization. Many of these advances are described in accompanying papers in these proceedings.

Keywords

Multilayer Film Atomic Plane Highly Orient Pyrolytic Graphite Interface Roughness Diffraction Vector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1987

Authors and Affiliations

  • Roy Clarke
    • 1
  1. 1.Department of PhysicsThe University of MichiganAnn ArborUSA

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