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Problem Solving Using Quantitative Stereology

  • R. T. DeHoff

Abstract

Stereology is a field that deals with the geometry of microstructures. During the past two decades, its mathematical foundations have been established, and a number of texts have appeared.1–5 Since it would not be possible to present a comprehensive overview of this tool in a single chapter, this chapter will focus upon those stereo-logical methods and relationships that are “general” in the sense of being valid for real microstructures of arbitrary complexity. It is fortunate, and perhaps remarkable, that these methods are also very straightforward and easy to implement.

Keywords

Lineal Feature Point Count Silicon Particle Counting Measurement Problem Solve 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    DeHoff, R. T. and Rhines, F. N. Quantitative Microscopy. New York: McGraw-Hill, 1968.Google Scholar
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    Underwood, E. E. Quantitative Stereology. Reading, MA: Addison-Wesley Press, 1970.Google Scholar
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    Serra, J. Image Analysis and Mathematical Morphometry. New York: Academic Press, 1981.Google Scholar
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    H. Elias, and Hyde, D. M. A Guide to Practical Stereology. New York: S. Krager AG, 1983.Google Scholar
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Copyright information

© Van Nostrand Reinhold Company Inc. 1986

Authors and Affiliations

  • R. T. DeHoff
    • 1
  1. 1.Department of Materials Science and EngineeringUniversity of FloridaUSA

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