Radiation Damage in Silicon Surface Barrier Detectors

  • H. W. Kraner
  • T. Ludlam
  • D. Kraus
  • J. Renardy
Part of the Ettore Majorana International Science Series book series (EMISS, volume 14)

Abstract

High energy protons and associated heavy particles including neutrons are expected to be the major cause of radiation damage in silicon detectors considered for use in high energy physics experiments. Device effects to be expected are energy resolution degradation due to carrier trapping by radiation introduced defects and leakage current increase from increased generation-regeneration of carriers through the defect levels.

Keywords

Titanium Resis Germanium 

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References

  1. 1.
    V.A.J. Van Lint, G. Gigas and J. Barengoltz, IEEE Trans. Nucl. Sci. NS-22, (1975) 2662.Google Scholar
  2. 2.
    J.R. Srour, S.C. Chen, S. Othmer and R.A. Hartman, IEEE Trans. Nucl. Sci. NS-26 (1979) 4784.Google Scholar
  3. 3.
    A.J. Stevens, Brookhaven National Laboratory, performed these calculations.Google Scholar
  4. 4.
    H.W. Kraner, R.H. Pehl and E.E. Haller, IEEE Trans. Nucl. Sci. NS-22 1, (1975) 149.CrossRefGoogle Scholar
  5. 5.
    E.E. Haller, W.L. Hanesn and F.S. Goulding, IEEE Trans. Nucl. Sci. NS-19, 3, (1972) 271.CrossRefGoogle Scholar
  6. 6.
    R. Grube, E. Fretwurst and G. Lindstrom, Nucl. Instrum and Methods 101, (1972) 97.CrossRefGoogle Scholar
  7. 7.
    E.H.M. Heijne, et al., CERN/EF/BEAM 80–6, submitted to Nucl. Instrum.and Methods (1980).Google Scholar
  8. 8.
    J.M. Meese, D.L. Cowan and M. Chandrasekar, IEEE Trans. Nucl. Sci. NS-26, 6, (1979 4858.Google Scholar

Copyright information

© Plenum Press, New York 1983

Authors and Affiliations

  • H. W. Kraner
    • 1
  • T. Ludlam
    • 1
  • D. Kraus
    • 1
  • J. Renardy
    • 1
  1. 1.Brookhaven National LaboratoryUptonUSA

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