TEM Characterization of Pillared Rectorites

  • J. M. Dominguez
  • M. L. Occelli


High resolution and analytical methods of electron microscopy have been used to characterize a sample of natural rectorite before and after pillaring with Al203-clusters. The regular 1:1 interstratification of mica-like and montmorillonite-like layers yield (variable) interlayer spacings of about 28Å. Nonuniform pillar distributions have been attributed to layer charge heterogeneity and to pillar deformation. Other defects, like stacking faults, layer termination edges, and bent stacks were characterized by electron diffraction. The true chemical composition was determined by EDS on the basis of crystal-by-crystal analysis.


Energy Dispersive Spectroscopy Electron Diffraction Pattern Interlayer Spacing Charge Density Wave Microporous Material 
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Copyright information

© Springer Science+Business Media New York 1992

Authors and Affiliations

  • J. M. Dominguez
    • 1
    • 2
  • M. L. Occelli
    • 1
    • 2
  1. 1.Inv. AplicadaInstituto Mexicano del PetroleoMexico 14, D.F.Mexico
  2. 2.Unocal CorporationBreaUSA

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