Advertisement

Superconducting Properties of Amorphous Multilayer Metal-Semiconductor Composites

  • A. M. Kadin
  • R. W. Burkhardt
  • J. T. Chen
  • J. E. Keem
  • S. R. Ovshinsky
Part of the Institute for Amorphous Studies Series book series (IASS)

Abstract

There has been considerable interest in the past decade in developing novel materials using precision microlayering techniques. Much of this has been oriented towards crystalline epitaxy, using pairs of materials with lattice spacings that almost match. However, for most other material pairs, layer interfaces tend to be dominated by dislocations, agglomeration and interdifussion, if allowed to thermally equilibra Le.

Keywords

Critical Field Multilayer Film Metallic Layer Parallel Field Critical Magnetic Field 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    S.R. Ovshinsky, U.S. Patent No. 4,343,044 (1982) and others pending.Google Scholar
  2. 2.
    I.K. Schuller and C.M. Kalco, Thin Solid Films 90, 221 (1982);ADSCrossRefGoogle Scholar
  3. 2a.
    C.S.L. Chun, C.G. Zheng, J. Vincent and I.K. Schuller, Phys. Rev. B 29, 4915 (1984).ADSCrossRefGoogle Scholar
  4. 3.
    D.B. McWhan, M. Gurvitch, J.M. Powell and L.R. Walker, J. Appl. Phys. 54, 3886 (1983).ADSCrossRefGoogle Scholar
  5. 4.
    W.P. Lowe and T.H. Geballe, Phys. Rev. B 29, 4961 (1984).ADSCrossRefGoogle Scholar
  6. 5.
    T.W. Haywood and D.G. Ast, Phys. Rev. B 18, 2225 (1978).ADSCrossRefGoogle Scholar
  7. 6.
    S.T. Ruggiero, I.W. Barbee and H.R. Beasley, Phys. Rev. Lett. 45, 1299 (1980);ADSCrossRefGoogle Scholar
  8. 6a.
    S.T. Ruggiero, I.W. Barbee and H.R. Beasley, Phys. Rev. B 26, 4894 (1982).ADSCrossRefGoogle Scholar
  9. 7.
    A.M. Kadin, R.W. Burkhardt, J.T. Chen, J.L. Keem and S.R. Ovshinsky, Proc. 17th Int. Conf. on Low Temp. Phys., Karlsruhe, West Germany, 1984, ed. by U. Eckern et al., p. 579 (Elsevier North-Holland, Amsterdam, 1984).Google Scholar
  10. 8.
    M.M. Collver and R.H. Hammond, Phys. Rev. Lett. 30, 92 (1973).ADSCrossRefGoogle Scholar
  11. 9.
    N.R. Werthamer, E. Helfand and P.C. Hohenberg, Phys. Rev. 147, 295 (1966).ADSCrossRefGoogle Scholar
  12. 10.
    R.A. Klemm, A. Luther and M.R. Beasley, Phys. Rev. B 12, 877 (1975).ADSCrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1991

Authors and Affiliations

  • A. M. Kadin
    • 1
  • R. W. Burkhardt
    • 1
  • J. T. Chen
    • 2
  • J. E. Keem
    • 1
  • S. R. Ovshinsky
    • 1
  1. 1.Energy Conversion DevicesTroyUSA
  2. 2.Department of PhysicsWayne State UniversityDetroitUSA

Personalised recommendations