Use of Total Reflection at the Critical Angle for Dispersion of Ultrasoft X-Rays

  • Heribert K. Herglotz
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 7a)


X-ray analysis of elements below sodium in atomic number has not yet become popular in laboratories where routine analyses must be carried out by personnel of limited training. In search of simpler methods to overcome this barrier, the wavelength dependence for the critical angle of total reflection was investigated theoretically and scouted experimentally. Development of an x-ray spectrograph for the routine analysis of light elements is encouraged by these results.


Total Reflection Critical Angle Enlargement Graphite Reflection Curve Knife Edge 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    A. H. Compton and R. L. Dosm, Proc. Natl. Acad. Sei. US 11, 598 (1925).CrossRefGoogle Scholar
  2. 2.
    H. Herglotz, Rontgenspektroskopie im ultraweichen Gebiet, Dokumentationszentrum für Technik und Wirtschaft, Vienna (1953).Google Scholar
  3. 3.
    M. Siegbahn and R. Thoraeus, Mat. Astr. Fys. 18, No. 24 (1924).Google Scholar
  4. 4.
    A. H. Compton and S. K. Allison,X-Rays in Theory and Experiment, D. Van Nostrand Co., Princeton, N.J. (1960), p. 305.Google Scholar
  5. 5.
    E. Dershem and M. Schein, Phys. Rev. 35, 292 (1930).Google Scholar
  6. 6.
    H. K. Herglotz, Nature 214, 263 (1967).CrossRefGoogle Scholar
  7. 7.
    H. K. Herglotz, J. Appl. Phys. 38, 4565 (1967).CrossRefGoogle Scholar
  8. 8.
    B. L. Henke, Application of Multilayer Analyzers to 15–150 Å Fluorescence Spectroscopy for Chemical and Valence Band Analysis, Advances in X-Ray Analysis, Vol. 9. G.R. Mallett, M. J. Fay, and W. M. Mueller, eds., Plenum Press, New York (1965), pp. 430–440.Google Scholar
  9. 9.
    H. K. Herglotz and E. Schiel, Nature 205, 1093 (1965).CrossRefGoogle Scholar

Copyright information

© Chicago Section of the society for Applied Spectroscopy 1969

Authors and Affiliations

  • Heribert K. Herglotz
    • 1
  1. 1.E. I. du Pont de Nemours & Co., Inc.Engineering Physics LaboratoryWilmingtonUSA

Personalised recommendations