An Apparatus for the Analysis of Liquid Samples by the X-Ray Fluorescence Method with a Vacuum Spectrograph
It is well known that analysis of elements by the X-ray fluorescence method is rapid, reliable, and nondestructive in nature, especially for those samples that are solid in the form. However, because of the attenuation of the secondary X-rays of longer wavelengths by the air path, analysis of elements with atomic number smaller than 22 necessitates the use of a helium atmosphere or a vacuum spectrometer. Where a helium atmosphere is used, a layer of thin Mylar or similar film is used on liquid samples. This film can be placed over the surface or on the bottom of liquid container when inverted optics are used. In recent days, sophisticated X-ray fluorescence vacuum spectrographs have been investigated and placed on the market by a number of manufacturers. These spectrographs have many outstanding and desirable features. However, the present vacuum spectrograph has a number of limitations. The purpose of this paper is to present an apparatus for the analysis of liquid samples using the X-ray fluorescence method with the vacuum spectrograph. The experimental results and their interpretations are presented and discussed.
KeywordsLiquid Sample Organosilicon Compound Sodium Metasilicate Metal Container Mylar Film
Unable to display preview. Download preview PDF.
- 1.Frank L. Chan, “A Study of Silicon Determination in Organo-silicon Compounds by X-ray Fluorescence with Vacuum Spectrograph,” in: Analytical Chemistry, Society of Analytical Chemistry of Great Britain (1965, in press).Google Scholar
- 2.Frank L. Chan, “Some Observations on the Use of Certain Analyzing Crystals for the Determination of Silicon and Aluminum,” in: W.M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances inX-ray Analysis, Vol. 9, Plenum Press, New York (in press).Google Scholar
- 3.General Electric X-Ray Department, “Vacuum Liquid Sample Cells,” Report No 11, Publication No. 7A-4022 (March 1, 1965 ).Google Scholar
- 4.Eugene P. Bertin, “Solution Techniques in X-Ray Spectrometric Analysis,” Norelco Reporter 12: 15 (1965).Google Scholar
- 5.Dow Corning Corporation Bulletin 05–058 and 05–059, Engineering Products Division, Midland, Michigan (September, 1963 ).Google Scholar
- 6.L.S. Birks, X-Ray Spectrochemical Analysis, Interscience Publishers, Inc., New York (1959).Google Scholar
- 7.H. A. Liebhafsky, H.G. Pfeiffer, E.H. Winslow, and P.D. Zemany, X-Ray Absorption and Emission in Analytical Chemistry, John Wiley & Sons, Inc., New York (1960).Google Scholar
- 8.H. H. Willard and H. Diehl, Advanced Quantitative Analysis, D. Van Nostrand Company, Inc.,Princeton, New Jersey (1943).Google Scholar
- 9.G. E. F. Lundell, H. A. Bright, and J.I. Hoffman, Applied Inorganic Analysis, 2nd ed., John Wiley & Sons, Inc., New York (1953).Google Scholar