An Apparatus for the Analysis of Liquid Samples by the X-Ray Fluorescence Method with a Vacuum Spectrograph

  • Frank L. Chan
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 5)


It is well known that analysis of elements by the X-ray fluorescence method is rapid, reliable, and nondestructive in nature, especially for those samples that are solid in the form. However, because of the attenuation of the secondary X-rays of longer wavelengths by the air path, analysis of elements with atomic number smaller than 22 necessitates the use of a helium atmosphere or a vacuum spectrometer. Where a helium atmosphere is used, a layer of thin Mylar or similar film is used on liquid samples. This film can be placed over the surface or on the bottom of liquid container when inverted optics are used. In recent days, sophisticated X-ray fluorescence vacuum spectrographs have been investigated and placed on the market by a number of manufacturers. These spectrographs have many outstanding and desirable features. However, the present vacuum spectrograph has a number of limitations. The purpose of this paper is to present an apparatus for the analysis of liquid samples using the X-ray fluorescence method with the vacuum spectrograph. The experimental results and their interpretations are presented and discussed.


Liquid Sample Organosilicon Compound Sodium Metasilicate Metal Container Mylar Film 


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Copyright information

© Chicago Section of the Society for Applied Spectroscopy 1966

Authors and Affiliations

  • Frank L. Chan
    • 1
  1. 1.Aerospace Research LaboratoriesWright-Patterson Air Force BaseDaytonUSA

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