The Measurement of Infrared Emission Spectra Using Multiple-Scan Interferometry

  • M. J. D. Low
  • I. Coleman
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 5)


A multiple-scan interference spectrometer is described, as are exploratory experiments with the application of the instrument to observe low-temperature emission spectra of various substances, The instrument is highly senstive and could be used for transmission, reflection, and emission spectroscopy, especially in situations where the signals obtained are weak.


Relative Emittance Multiple Scanning Core Memory Audio Frequency Sawtooth Signal 
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Copyright information

© Chicago Section of the Society for Applied Spectroscopy 1966

Authors and Affiliations

  • M. J. D. Low
    • 1
  • I. Coleman
    • 2
  1. 1.Rutgers, The State UniversityNew BrunswickUSA
  2. 2.Block Engineering Company, Inc.CambridgeUSA

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