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X-ray Absorption Fine Structure in Glass

  • W. F. Nelson
  • I. Siegel
  • R. Wagner
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 2)

Abstract

When considering such things as electronic behavior or structure-dependent phenomena in solids (including glass), one is faced with the problem of finding ways to make measurements which yield information about events and mechanisms on a microscopic or atomic scale. In other words, although a great deal can be learned from the many macroscopic measurements available, there comes a time when the results must be relatable to behavior and mechanisms involving the individual entities making up the solid.

Keywords

Electron Spin Resonance Iron Foil Sodium Disilicate Diffraction Unit Main Absorption Edge 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    L.G. Parratt, Phys. Rev. 56, 295 (1939).CrossRefGoogle Scholar
  2. 2.
    S. T. Stephenson, R. Krogstad, and W. Nelson, Phys. Rev. 84, 806 (1951).CrossRefGoogle Scholar
  3. 3.
    R.deL. Kronig, Z. Physik 75, 191 (1932).CrossRefGoogle Scholar
  4. 4.
    T. Hayashi, Sci. Repts. Tohoku Univ., Ser. 1, 33, 123, 183 (1949);Google Scholar
  5. T. Hayashi, Sci. Repts. Tohoku Univ., Ser. 34, 185 (1950).Google Scholar
  6. 5.
    A.L Kostarev, Zhur. ekspd. teoret. Fiz, SSSR. 11,60 (1941);Google Scholar
  7. A.L Kostarev, Zhur. ekspd. teoret. Fiz, SSSR. 19, 413 (1949);Google Scholar
  8. A.L Kostarev, Zhur. ekspd. teoret. Fiz, SSSR. 21, 917 (1951).Google Scholar
  9. 6.
    T. Shiraiwa, T. Ishimura, and M. Sawada, J. Phys. Soc. Japan 13, 8, 847 (1958).CrossRefGoogle Scholar
  10. 7.
    A.H. Barnes, Phys. Rev. 44, 141 (1933).CrossRefGoogle Scholar
  11. 8.
    C. Kurylenko, Cahiers de phys. 70, 35 (1956).Google Scholar
  12. 9.
    W. W. Beeman and H. Friedman, Phys. Rev. 56, 392 (1939).CrossRefGoogle Scholar
  13. 10.
    M.H. Hulubei and Y. Cauchois, Compt. rend. 211, 3161 (1940).Google Scholar
  14. 11.
    W. F. Nelson, Ph. D. Thesis, Washington State College (1956), University Microfilms, Ann. ArborGoogle Scholar
  15. 12.
    D.G. Doran and S.T. Stephenson, Phys. Rev. 105, 1156 (1957).CrossRefGoogle Scholar
  16. 13.
    J.M. El-Hussaini and S.T. Stephenson, Phys. Rev. 109, 51 (1958).CrossRefGoogle Scholar
  17. 14.
    K. Tsutumi and M. Obashi, J. Phys. Japan 13, 591 (1958).CrossRefGoogle Scholar
  18. 15.
    J.N. Singh. Phys. Rev. 123, 1724 (1961).CrossRefGoogle Scholar
  19. 16.
    M.H. Hululiei and Y. Cauchois, Compt. rend. 211, 316 (1940).Google Scholar
  20. 17.
    V. V. Obukhov-Denisov, N. N. Sobolev, and V. P. Cheremisinov, Opt. i spekt. 8, 4, 267 (1960);Google Scholar
  21. V. V. Obukhov-Denisov, N. N. Sobolev, and V. P. Cheremisinov, E.R. Lippincott et al. J. Res. Nat. Bur. Std. 61, 61 (1958).Google Scholar
  22. 18.
    F.W. Lytle, this volume, p. 285Google Scholar

Copyright information

© Society for Applied Spectroscopy Chicago, Illinois 1963

Authors and Affiliations

  • W. F. Nelson
    • 1
  • I. Siegel
    • 1
  • R. Wagner
    • 1
  1. 1.Fundamental Research SectionOwens-Illinois Technical CenterToledoUSA

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