Applications of X-Ray Absorption Edge Analysis

  • E. A. Hakkila
  • G. R. Waterbury
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 2)


The X-ray absorption edge technique using secondary targets as radiation sources was applied to the determination of some elements, including rhodium, uranium, yttrium, tantalum, cobalt, and cerium, that have absorption edges in the wavelength region from 0.53 to 2.2 A. Polystyrene absorption cells having path lengths between 0.12 and 3.0 cm were found to be satisfactory. For the longer wavelength radiation, the cells of shorter path length were used, and the sensitivity and precision were increased by using a low-density low-mo- lecular weight diluent such as isopropyl alcohol. At optimum concentrations, relative standard deviations in the range of 0.2 to were obtained. This secondary target technique requires only standard X-ray fluorescence equipment with simple and inexpensive modifications that can be attached or removed in a few minutes.


Absorption Edge Impurity Element Matrix Error Reactor Fuel Secondary Target 
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Copyright information

© Society for Applied Spectroscopy Chicago, Illinois 1963

Authors and Affiliations

  • E. A. Hakkila
    • 1
  • G. R. Waterbury
    • 1
  1. 1.The Los Alamos Scientific LaboratoryUniversity of CaliforniaLos AlamosUSA

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