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Applications of X-Ray Absorption Edge Analysis

  • E. A. Hakkila
  • G. R. Waterbury
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 2)

Abstract

The X-ray absorption edge technique using secondary targets as radiation sources was applied to the determination of some elements, including rhodium, uranium, yttrium, tantalum, cobalt, and cerium, that have absorption edges in the wavelength region from 0.53 to 2.2 A. Polystyrene absorption cells having path lengths between 0.12 and 3.0 cm were found to be satisfactory. For the longer wavelength radiation, the cells of shorter path length were used, and the sensitivity and precision were increased by using a low-density low-mo- lecular weight diluent such as isopropyl alcohol. At optimum concentrations, relative standard deviations in the range of 0.2 to were obtained. This secondary target technique requires only standard X-ray fluorescence equipment with simple and inexpensive modifications that can be attached or removed in a few minutes.

Keywords

Absorption Edge Impurity Element Matrix Error Reactor Fuel Secondary Target 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    R.H. Barieau, Anal. Chem. 29, 348 (1957).CrossRefGoogle Scholar
  2. 2.
    A.H. Compton and S. K. Allison, X-Rays in Theory and Experiment, 2nd ed„ D. Van Nostrand. Inc.. New York (1935), pp. 800–806.Google Scholar
  3. 3.
    W. C. Dietrich and R. E. Barringer, U. S. Atomic Energy Commission Report Y-1153 (1957).Google Scholar
  4. 4.
    C. G. Dodd, Advances in X-Ray Analysis, Vol. 3, Plenum Press, New York (1960), pp. 11–39.CrossRefGoogle Scholar
  5. 5.
    A. Engstrom. Acta Radiol. Supp. Vol. 63 (1946).Google Scholar
  6. 6.
    A. Engstrom, Rev. Sci. Instr. 18, 681 (1947).CrossRefGoogle Scholar
  7. 7.
    E.A. Hakkila, Anal. Chem. 33, 1012. (1961).CrossRefGoogle Scholar
  8. 8.
    E.A. Hakkila and G.R. Waterbury, Advances in X-RayAnalysis, Vol. 5, Plenum Press, New York (1962), pp. 379–388.CrossRefGoogle Scholar
  9. 9.
    H.R. Hughs and F.P. Hochgesang, Anal. Chem. 22, 1248 (1950).CrossRefGoogle Scholar
  10. 10.
    W. F. Peed and H. W. Dunn, U. S. Atomic Energy Commission Report ORNL-1265 (1952).Google Scholar
  11. 11.
    J.H. Stewart Jr., Anal. Chem. 32, 1090 (1960).CrossRefGoogle Scholar
  12. 12.
    W. B. Wright and R. E. Barringer, U. S. Atomic Energy Commission Report Y-1095 (1955).Google Scholar

Copyright information

© Society for Applied Spectroscopy Chicago, Illinois 1963

Authors and Affiliations

  • E. A. Hakkila
    • 1
  • G. R. Waterbury
    • 1
  1. 1.The Los Alamos Scientific LaboratoryUniversity of CaliforniaLos AlamosUSA

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