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X-Ray Absorption Fine-Structure Investigations at Cryogenic Temperatures

  • Farrel W. Lytle
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 2)

Abstract

The temperature dependence of the extended X-ray absorption fine structure was investigated in the range from 9-573°K. It was found that the temperature dependence of the intensity of the fine structure features was quantitatively accounted for by applying the Debye-Waller factor. A change in position of the features with the expansion and contraction of the lattice was also observed. These experimental data suggest a simple diffraction (Krönig theory) mechanism; however, the observed absorption minima do not agree with those predicted by the Krönig equation. The single-crystal. X-ray spectrometer. X-ray cryostat, and experimental conditions are also discussed in some detail.

Keywords

Cryogenic Temperature Electron Volt Waller Factor Central Chamber Electron Energy Loss Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Society for Applied Spectroscopy Chicago, Illinois 1963

Authors and Affiliations

  • Farrel W. Lytle
    • 1
  1. 1.Boeing Scientific Research LaboratoriesSeattleUSA

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