X-Ray Absorption Fine-Structure Investigations at Cryogenic Temperatures
The temperature dependence of the extended X-ray absorption fine structure was investigated in the range from 9-573°K. It was found that the temperature dependence of the intensity of the fine structure features was quantitatively accounted for by applying the Debye-Waller factor. A change in position of the features with the expansion and contraction of the lattice was also observed. These experimental data suggest a simple diffraction (Krönig theory) mechanism; however, the observed absorption minima do not agree with those predicted by the Krönig equation. The single-crystal. X-ray spectrometer. X-ray cryostat, and experimental conditions are also discussed in some detail.
KeywordsCryogenic Temperature Electron Volt Waller Factor Central Chamber Electron Energy Loss Spectrum
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