Detection and Identification of Potential Impurities Activated by Neutron Irradiation of Czochralski Silicon
A worst-case experiment was carried out wherein a matrix of Czochralski-grown silicon crystals irradiated to the five ohm-cm level was analyzed for radioactive isotopes that might result from activation of impurities initially present in the crystals. A computer study was used to predict the nuclides most likely to occur. Results from the two methods of analysis—radioactivity decay rate and gamma spectroscopy—were consistent with each other. Methods of measurements, calibrations and calculations to assure that radioactivity levels do not exceed the Nuclear Regulatory Commission exempt concentrations standards are presented.
KeywordsNeutron Irradiation Beta Decay Gamma Spectroscopy Nuclear Regulatory Commission Potential Impurity
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