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Abstract

The third critical field of a system comprising a thin superconducting film deposited on the flat surface of a massive superconductor is calculated. It is considered that the film differs from the substrate simply in respect of the mean free path of the electrons. Two limiting cases are considered: those of a thin and a thick film respectively. A qualitative explanation is given for the experimentally-observed dependence of the third critical field of a superconductor on the mechanical and heat treatment of the surface.

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Copyright information

© Consultants Bureau, New York 1970

Authors and Affiliations

  • V. V. Shmidt

There are no affiliations available

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