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A Study on the Change of Water of Crystallization by X-Ray Diffraction Data Stored in ASTM Magnetic Tape

  • Frank L. Chan
  • G. G. JohnsonJr.
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 8)

Abstract

One of the important uses of x-ray diffraction data has been the detection, identification, and semiquantitative determination of the existence of a number of molecules of water in an organic or an inorganic compound. Listings of the hydrated compounds are to be found in the ASTM x-ray diffraction file. Among the 18,000 entries, some of them are known to have water of crystallization ranging from one to as many as five or more molecules. The ASTM x-ray diffraction data have been computerized. In its latest version, a search by Fortran IV on the change of water of crystallization involving one or more species can be carried out in a matter of seconds. For this study, any change in water of crystallization due to experimental conditions resulting in the appearance of new x-ray diffraction patterns is ascertained by introducing these data to the computer. Specific examples will be given in this paper.

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References

  1. 1.
    J. D. Hanawalt, H. W. Rinn, and L. K. Frevel, Ind. Eng. Chem., Anal. Dd. 10, 457 (1938).Google Scholar
  2. 2.
    Alphabetical and Grouped Numerical Index of X-Ray Diffraction Data, Special Technical Publication No. 48B, American Society for Testing Materials, Philadelphia, Pa. (1950). Google Scholar
  3. 3.
    National Bureau of Standards Monograph 25, Section 6, 10 (1968).Google Scholar
  4. 4.
    Fink Inorganic Index to the Powder Diffraction File ASTM Publication PDIS-18f, American Society for Testing and Materials, Philadelphia, Pa. (1968).Google Scholar
  5. 5.
    Inorganic Index to the Powder Diffraction File 1968, ASTM Publication PDIS-18i, American Society for Testing and Materials, Philadelphia, Pa. (1968).Google Scholar
  6. 6.
    Organic Index to the Powder Diffraction File 1968, ASTM Publication PDIS-18o, American Society for Testing and Materials, Philadelphia, Pa. (1968).Google Scholar
  7. 7.
    KWIC Guide to the Inorganic Patterns of the Powder Diffraction File, ASTM Publication PDIS-18k, American Society for Testing and Materials, Philadelphia, Pa. (1968).Google Scholar
  8. 8.
    V. Vand and G. G. Johnson, Fortran IV Programs (Version 7) for the Identification of Multiphase Unknown Powder Diffraction Patterns, American Society for Testing and Materials, Philadelphia, Pa. (1968).Google Scholar
  9. 9.
    F. L. Chan and R. W. Moshier, X-Ray Powder Patterns and Index, Metal Compounds with n-Benzoyl-N-Phenylhydroxylamine, WADC Technical Report 59–533 (1959).Google Scholar
  10. 10.
    F. L. Chan and Leonard Spialter, Perarylated Silanes. Identification by X-Ray Diffraction Powder Patterns, WADC Technical Report 59–512 (1959).Google Scholar
  11. 11.
    F. L. Chan, Some Modifications of the X-Ray Instruments and Their Utilization to the Study of Analytical Problems, Norelco Reporter 10, 133 (1963).Google Scholar
  12. 12.
    H. P. Klug and L. E. Alexander, X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, Chapman and Hall, Ltd., London (1954).Google Scholar
  13. 13.
    G. G. Johnson, Jr. and Vand, A Computerized Powder Diffraction Identification System, Ind. Eng. Chem. 59, 19 (1967).CrossRefGoogle Scholar
  14. 14.
    L. K. Frevel, Anal. Chem. 37, 471 (1965).CrossRefGoogle Scholar
  15. 15.
    M. Nichols, Twenty-Fourth Pittsburgh Diffraction Conference, Paper No. B-3 (1966).Google Scholar
  16. 16.
    L. Gordon, M. L. Salutsky and H. H. Willard, Precipitation from Homogeneous Solution, John Wiley amp; Sons, (1959).Google Scholar
  17. 17.
    F. Feigl, Spot Tests in Inorganic Analysis, Elsevier, Amsterdam (1958).Google Scholar

Copyright information

© Chicago Section of the Society for Applied Spectroscopy 1970

Authors and Affiliations

  • Frank L. Chan
    • 1
  • G. G. JohnsonJr.
    • 2
  1. 1.Aerospace Research LaboratoriesWright-Patterson Air ForceBaseUSA
  2. 2.Department of Computer SciencePennsylvania State UniversityUniversity ParkUSA

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