Direct Spectrographic Determination of Trace Impurities in Ultrahigh-Purity Silver Nitrate Crystals

  • V. Le Roy
  • A. J. Lincoln
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 8)


A direct spectrographic method is described for the determination of 25 trace impurities in ultrahigh-purity silver nitrate crystals with limits of sensitivities for many elements in the range 0.005–5.0 ppm. Through the use of spectrographic buffers and specially designed electrodes, it has been possible to increase the sensitivity by several orders of magnitude for a number of impurities and to achieve sensitivities equivalent to concentration ranges previously obtained by chemical concentration of certain other impurities prior to spectrographic analysis. Conditions of analysis, volatilization studies, analytical curves, and limits of sensitivities are presented. The average precision is 19%, expressed as coefficient of variation.


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Copyright information

© Chicago Section of the Society for Applied Spectroscopy 1970

Authors and Affiliations

  • V. Le Roy
    • 1
  • A. J. Lincoln
    • 1
  1. 1.Instrumental Analysis Laboratory Engelhard Industries DivisionEngelhard Minerals & Chemicals CorporationNewarkUSA

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