Cluster Ion Emission from Cesium Chloride Bombarded with Atomic and Molecular Ions
Yields of (CsCl)nCs+ secondary ions, sputtered from vapour-deposited CsCl layers, were measured under bombardment with either atomic or molecular ions at energies between 24 and 31 keV. The secondary ion yields were found to decrease with increasing cluster size n (n < 10), more rapidly the lower mass of the primary ion. The yields observed for molecular ion impact (SF6 mass 146 u) were significantly higher than for atomic primary ions of about the same mass (Xe+, mass 130 u), the enhancemend factor being as large as 6 for n > 3.
KeywordsImpact Angle Increase Cluster Size Cesium Chloride Primary Pulse Stainless Steel Backing
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