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Cluster Ion Emission from Cesium Chloride Bombarded with Atomic and Molecular Ions

  • W. Szymczak
  • K. Wittmaack
Part of the NATO ASI Series book series (NSSB, volume 269)

Abstract

Yields of (CsCl)nCs+ secondary ions, sputtered from vapour-deposited CsCl layers, were measured under bombardment with either atomic or molecular ions at energies between 24 and 31 keV. The secondary ion yields were found to decrease with increasing cluster size n (n < 10), more rapidly the lower mass of the primary ion. The yields observed for molecular ion impact (SF6 mass 146 u) were significantly higher than for atomic primary ions of about the same mass (Xe+, mass 130 u), the enhancemend factor being as large as 6 for n > 3.

Keywords

Impact Angle Increase Cluster Size Cesium Chloride Primary Pulse Stainless Steel Backing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1991

Authors and Affiliations

  • W. Szymczak
    • 1
  • K. Wittmaack
    • 1
  1. 1.GSFInstitut für StrahlenschutzNeuherbergFed. Rep. Germany

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