Cluster Ion Emission from Cesium Chloride Bombarded with Atomic and Molecular Ions

  • W. Szymczak
  • K. Wittmaack
Part of the NATO ASI Series book series (NSSB, volume 269)


Yields of (CsCl)nCs+ secondary ions, sputtered from vapour-deposited CsCl layers, were measured under bombardment with either atomic or molecular ions at energies between 24 and 31 keV. The secondary ion yields were found to decrease with increasing cluster size n (n < 10), more rapidly the lower mass of the primary ion. The yields observed for molecular ion impact (SF6 mass 146 u) were significantly higher than for atomic primary ions of about the same mass (Xe+, mass 130 u), the enhancemend factor being as large as 6 for n > 3.


Impact Angle Increase Cluster Size Cesium Chloride Primary Pulse Stainless Steel Backing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    M. Salehpour, D.L. Fishel and J.E. Hunt, Int. Mass Spectrom. Ion Proc. 84 (1988) R7.CrossRefGoogle Scholar
  2. 2.
    M.G. Blain, S. Della Negra, H. Joret, Y. LeBeyec and E.A. Schweikert, Phys. Rev. Lett. 63 (1989) 1625.ADSCrossRefGoogle Scholar
  3. 3.
    O.W. Hand, T.K. Majumdar and R.G. Cooks, Int. Mass Spectrom. Ion Proc. 97 (1990) 35.CrossRefGoogle Scholar
  4. 4.
    W. Szymczak and K. Wittmaack, Secondary Ion Mass Spectrometry, SIMS VI, ed. by A. Benninghoven, A. M. Huber and H.W. Werner, Wiley, New York (1988) p. 243.Google Scholar
  5. 5.
    W. Szymczak and K. Wittmaack, Secondary Ion Mass Spectrometry, SIMS VII, ed. by A. Benninghoven, C.A. Evans Jr., K. McKeegan, H.A. Storms and H.W. Werner, Wiley, New York (1990) p. 65.Google Scholar
  6. 6.
    W. Szymczak and K. Wittmaack, to be published.Google Scholar
  7. 7.
    R. Moshammer, diploma work, Technical University, Darmstadt, 1987.Google Scholar
  8. 8.
    W. Ens, R. Beavis and K.G. Standing, Phys. Rev. Lett. 50 (1983) 27.ADSCrossRefGoogle Scholar
  9. 9.
    B. Schueler, R. Beavis, W. Ens, D.E. Main and K.G. Standing, Surf. Sci. 160 (1985) 571.ADSCrossRefGoogle Scholar
  10. 10.
    H.H. Anderson and H.L. Bay in “Sputtering by Particle Bombardment I”, ed. by R. Behrisch, Springer, Berlin (1981) p. 145.CrossRefGoogle Scholar
  11. 11.
    P. Williams and B.U.R. Sundqvist, Phys. Rev. Lett. 58 (1987) 1031.ADSCrossRefGoogle Scholar
  12. 12.
    D.E. Harrison Jr., Radiat. Eff. 70 (1983) 1.CrossRefGoogle Scholar
  13. 13.
    W. Eckstein, Nucl Instrum. Methods B33 (1988) 489.ADSGoogle Scholar

Copyright information

© Plenum Press, New York 1991

Authors and Affiliations

  • W. Szymczak
    • 1
  • K. Wittmaack
    • 1
  1. 1.GSFInstitut für StrahlenschutzNeuherbergFed. Rep. Germany

Personalised recommendations