Skip to main content

Intercomparison of Micrometer, Nanometer and Picometer Wavelengths

  • Conference paper

Abstract

We have undertaken to arrange a group of wavelength measurements in such a way as to assure that each is well tied to a standard wavelength common to all. [This wavelength is, in fact, the 606 nm emission from 86Kr at the N2 triple point which is the defined wavelength, although such a pedigree is unnecessary in this story.] By coordination with some aspects of the work of Earnest Kessler on the Rydberg (reported at this meeting) and of Horace Bowman and Randall Schoonover on density we plan to tie together the Rydberg (R), Avogadro’s constant (No), the electron’s Compton wavelength (λc = h/mc), the scale of γ-ray wavelengths (eg, the 411 keV emission from Au) and the scale of x-ray wavelengths (as might be characterized by a value for ∧, the x-ray-metric conversion factor).

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. KESSLER, E., NBS Special Publication. Proceedings of the International Conference on Precision Measurement and Fundamental Constants, Gaithersburg, Md., August 1970, and this conference.

    Google Scholar 

  2. MIELENZ, K. D., NBS Special Publication. Proceedings of the International Conference on Precision Measurement and Fundamental Constants, Gaithersburg, Md., August 1970.

    Google Scholar 

  3. BARGER, R., this conference

    Google Scholar 

  4. SAUDER, W. C., NBS Special Publication. Proceedings of the International Conference on Precision Measurement and Fundamental Constants, Gaithersburg, Md., Autust 1970; SAUDER, W. C., J. Res. NBS 722, 91 (1968); SAUDER, W. C. and DESLATTES, R. D., ibid. 712, 347 (1967).

    Google Scholar 

  5. DESLATTES, R. D., Appl. Phys. Letters, 15, No. 11, 386 (1969).

    Google Scholar 

  6. DESLATTES, R. D., Rev. Sci. Instr., 38. 815 (1967).

    Article  ADS  Google Scholar 

  7. BOWMAN, H. A. and SCHOONOVER, R. M., J. Res. NBS 2E, 179 (1967).

    Google Scholar 

  8. BEARDEN, J. A., Rev. Mod. Phys., 39, 78 (1967).

    Article  ADS  Google Scholar 

  9. HENINS, I. and BEARDEN, J. A., Phys. Rev., A135, 890 (1964).

    Article  ADS  Google Scholar 

  10. TAYLOR, B. N., PARKER, W. H. and LANGENBERG, D. N., Rev. Mod. Phys., Al, 375 (1969).

    Google Scholar 

  11. COHEN, E. R. and DUMOND, J. W. M., Rev. Mod. Phys., 37, 537 (1965).

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1972 Plenum Publishing Company Ltd

About this paper

Cite this paper

Deslattes, R.D., Sauder, W.C. (1972). Intercomparison of Micrometer, Nanometer and Picometer Wavelengths. In: Sanders, J.H., Wapstra, A.H. (eds) Atomic Masses and Fundamental Constants 4. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7876-1_37

Download citation

  • DOI: https://doi.org/10.1007/978-1-4684-7876-1_37

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-7878-5

  • Online ISBN: 978-1-4684-7876-1

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics