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The Normal Fluid Fraction in the Adsorbed Helium Film

  • L. C. Yang
  • Marvin Chester
  • J. B. Stephens

Abstract

The resonant frequency of a thickness-shear mode oscillating quartz crystal is lowered by virtue of the mass loading of any film laid down on its surfaces.1,2 For a uniformly deposited, thin solid film with thickness less than 1% or so of the crystal thickness this change Δf, is given by the formula
$$ - \Delta f = 2(2{f^2}/c{\rho _q})\sigma $$
(1)
Here σ represents that part of the mass per unit area which remains rigidly coupled to the substrate motion, f is the resonant frequency, c is the shear wave velocity in the crystal, and ρ q is the density of the quartz.

Keywords

Shear Wave Velocity Helium Atom Relative Saturation Superfluid Fraction Adsorption Isotherm Curve 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    G. Sauerbrey, Z. Physik 155, 206 (1959).ADSCrossRefGoogle Scholar
  2. 2.
    C. D. Stockbridge, in Vacuum Microbalance Techniques, K. H. Behrndt, ed., Plenum, New York (1966), Vol. 5, p. 147–205.Google Scholar
  3. 3.
    M. Chester, L. C. Yang, and J. B. Stephens, Phys. Rev. Leu. 29, 211 (1972).ADSCrossRefGoogle Scholar
  4. 4.
    R. S. Kagiwada, J. C. Fraser, I. Rudnick, and D. Bergman, Phys. Rev. Leu. 22, 338 (1969).ADSCrossRefGoogle Scholar
  5. 5.
    J. B. Brown and M. G. Tong, in Proc. 12th Intern. Con/: Low Temp. Phys., 1970, Academic Press of Japan, Tokyo (1971), p. 113.Google Scholar

Copyright information

© Springer Science+Business Media New York 1974

Authors and Affiliations

  • L. C. Yang
    • 1
    • 2
  • Marvin Chester
    • 1
  • J. B. Stephens
    • 2
  1. 1.Physics DepartmentUniversity of CaliforniaLos AngelesUSA
  2. 2.Jet Propulsion LaboratoryCalifornia Institute of TechnologyPasadenaUSA

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