The Normal Fluid Fraction in the Adsorbed Helium Film

  • L. C. Yang
  • Marvin Chester
  • J. B. Stephens


The resonant frequency of a thickness-shear mode oscillating quartz crystal is lowered by virtue of the mass loading of any film laid down on its surfaces.1,2 For a uniformly deposited, thin solid film with thickness less than 1% or so of the crystal thickness this change Δf, is given by the formula
$$ - \Delta f = 2(2{f^2}/c{\rho _q})\sigma $$
Here σ represents that part of the mass per unit area which remains rigidly coupled to the substrate motion, f is the resonant frequency, c is the shear wave velocity in the crystal, and ρ q is the density of the quartz.


Shear Wave Velocity Helium Atom Relative Saturation Superfluid Fraction Adsorption Isotherm Curve 
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Copyright information

© Springer Science+Business Media New York 1974

Authors and Affiliations

  • L. C. Yang
    • 1
    • 2
  • Marvin Chester
    • 1
  • J. B. Stephens
    • 2
  1. 1.Physics DepartmentUniversity of CaliforniaLos AngelesUSA
  2. 2.Jet Propulsion LaboratoryCalifornia Institute of TechnologyPasadenaUSA

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