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Ellipsometric Measurements of the Saturated Helium Film

  • C. C. Matheson
  • J. L. Horn

Abstract

The ellipsometric technique was first used to measure helium film thicknesses by Burge and Jackson1 in 1951, and ellipsometric measurements of the film have been reported sporadically over the past two decades.

Keywords

Ellipsometric Measurement Moire Fringe Helium Film Fresnel Reflection Coefficient Bath Level 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    E. J. Burge and L. C. Jackson, Proc. Roy. Soc. A. 205, 270 (1951).ADSCrossRefGoogle Scholar
  2. 2.
    C. C. Matheson, J. G. Wright, H. Norris, and R. Gundermann, to be published.Google Scholar
  3. 3.
    D. G. Blair and C. C. Matheson, Cryogenics 10, 513 (1970).CrossRefGoogle Scholar
  4. 4.
    F. L. McCrackin, NBS Tech. Note 479 (1969).Google Scholar
  5. 5.
    M. H. Edwards, Can. J. Phys. 36, 884 (1958).ADSCrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1974

Authors and Affiliations

  • C. C. Matheson
    • 1
  • J. L. Horn
    • 1
  1. 1.School of Mathematics and PhysicsUniversity of East AngliaNorwichEngland

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