IR-PAS Studies: Signal-To-Noise Enhancement and Depth Profile Analysis

  • Richard W. Duerst
  • P. Mahmoodi
  • Marilyn D. Duerst
Part of the Polymer Science and Technology book series (POLS, volume 36)


The IR-PAS technique is hampered in many instances in its applications by the low signal-to-noise (S/N) ratio, which is generally due to environmental noise present around the equipment. A chamber is described which acoustically isolates the detector, resulting in a S/N ratio enhancement of more than a factor of three. Preliminary studies involving different mirror velocities hint that a phase delay may exist between a given interferometer modulation frequency and the corresponding acoustical wave, a phenomenon which may be applicable to depth profile studies.


Depth Profile Phase Delay Attenuate Total Reflectance Environmental Noise Carbonyl Band 
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Copyright information

© Plenum Press, New York 1987

Authors and Affiliations

  • Richard W. Duerst
    • 1
  • P. Mahmoodi
    • 1
  • Marilyn D. Duerst
    • 2
  1. 1.Central Research Laboratories3M CompanySt. PaulUSA
  2. 2.Chemistry DepartmentUniversity of Wisconsin-River FallsRiver FallsUSA

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