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IR-PAS Studies: Signal-To-Noise Enhancement and Depth Profile Analysis

  • Richard W. Duerst
  • P. Mahmoodi
  • Marilyn D. Duerst
Part of the Polymer Science and Technology book series (POLS, volume 36)

Abstract

The IR-PAS technique is hampered in many instances in its applications by the low signal-to-noise (S/N) ratio, which is generally due to environmental noise present around the equipment. A chamber is described which acoustically isolates the detector, resulting in a S/N ratio enhancement of more than a factor of three. Preliminary studies involving different mirror velocities hint that a phase delay may exist between a given interferometer modulation frequency and the corresponding acoustical wave, a phenomenon which may be applicable to depth profile studies.

Keywords

Depth Profile Phase Delay Attenuate Total Reflectance Environmental Noise Carbonyl Band 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1987

Authors and Affiliations

  • Richard W. Duerst
    • 1
  • P. Mahmoodi
    • 1
  • Marilyn D. Duerst
    • 2
  1. 1.Central Research Laboratories3M CompanySt. PaulUSA
  2. 2.Chemistry DepartmentUniversity of Wisconsin-River FallsRiver FallsUSA

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