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The Effect of Chemical Combination on the K X-ray Spectra of Silicon

  • Donald M. Koffman
  • Sheldon H. Moll
Conference paper

Abstract

Intensities and wavelengths of the K-series lines of silicon were measured using primary excitation in the electron probe. Specifically, intensity and line position data for the Si K spectral lines α1, α2, β, α3, and α4 were recorded using a high-resolution continuously curved mica-crystal vacuum spectrometer. Spectra were obtained from silicon metal and a wide range of mineral samples, e.g., SiO2, Mg2Si2O6, CaSiO3, KA1Si2O6, CaMgSi2O6, KA1Si3O8, NaA1Si3O8, CaAl2Si2O8, Fe2SiO4, and (Na, K) (Al, Si)2O4. Only slight differences were found to exist among the mineral spectra, but these differed markedly from that obtained from silicon metal.

Keywords

Boron Nitride Titanium Nitride Chemical Combination Satellite Line Silicon Metal 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • Donald M. Koffman
    • 1
  • Sheldon H. Moll
    • 1
  1. 1.Advanced Metals Research CorporationBurlingtonUSA

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