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A Modification of the Scanning X-Ray Topographic Camera (Lang’s Method)

  • Mitsuru Yoshimatsu
  • Atsushi Shibata
  • Kazutake Kohra

Abstract

A modification of the scanning X-ray topographic camera is reported. The specimen and photoplate are traversed back and forth independently in two directions rather than in the same direction as in the case of Lang’s camera. The distortions of the photographs caused by geometrical arrangement can be eliminated through this construction so as to have a one-to-one correspondence. Examples of reflection photographs as well as transmission photographs are shown. Some of them are compared with those taken using Lang’s camera. The dislocation images in the reflection photographs show a good one-to-one correspondence to those in the transmission photographs. The broadening of the dislocation images in the traversing direction is discussed. The present camera is especially useful for the studies of lattice defects in the thick specimens because the reflection photographs can be easily taken.

Keywords

Silicon Crystal Surface Reflection Silicon Single Crystal Reflection Angle Transmission Case 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Wolfgang Berg, “An X-Ray Method for Study of Lattice Disturbances of Crystals,” Naturwiss. 19: 391–396, 1931.CrossRefGoogle Scholar
  2. 2.
    C. S. Barrett, “A New Microscopy and its Potentialities,” Trans. AIME 161: 15–65, 1945.Google Scholar
  3. 3.
    J. B. Newkirk, “Observations of Dislocations and Other Imperfections by X-Ray Extinction Contrast,” Trans. AIME 215: 483–497, 1959.Google Scholar
  4. 4.
    A. R. Lang, “The Projection Topograph: A New Method in X-Ray Diffraction Microradiography,” Acta Cryst. 12: 249–250, 1959.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • Mitsuru Yoshimatsu
    • 1
  • Atsushi Shibata
    • 1
  • Kazutake Kohra
    • 2
  1. 1.Rigaku Denki Company Ltd.Haijima, Akishima, TokyoJapan
  2. 2.University of TokyoBunkyo-ku, TokyoJapan

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