A Modification of the Scanning X-Ray Topographic Camera (Lang’s Method)
A modification of the scanning X-ray topographic camera is reported. The specimen and photoplate are traversed back and forth independently in two directions rather than in the same direction as in the case of Lang’s camera. The distortions of the photographs caused by geometrical arrangement can be eliminated through this construction so as to have a one-to-one correspondence. Examples of reflection photographs as well as transmission photographs are shown. Some of them are compared with those taken using Lang’s camera. The dislocation images in the reflection photographs show a good one-to-one correspondence to those in the transmission photographs. The broadening of the dislocation images in the traversing direction is discussed. The present camera is especially useful for the studies of lattice defects in the thick specimens because the reflection photographs can be easily taken.
KeywordsSilicon Crystal Surface Reflection Silicon Single Crystal Reflection Angle Transmission Case
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