Correction for Non-Linearity of Proportional Counter Systems in Electron Probe X-Ray Microanalysis

  • Kurt F. J. Heinrich
  • Donald Vieth
  • Harvey Yakowitz
Conference paper


While the theoretical basis for the correction of non-linearity of detector systems is well known, methods for the determination of dead-time effects must be adapted to electron probe microanalyzer systems. Two such methods, one employing both X-ray and current measurements and the other employing simultaneous X-ray measurements on two spectrometers, are described. The effect of pulse-height shrinkage at high counting rates on the linearity of the detector system is discussed. When the proposed corrections for the dead-time of X-ray detector systems employing proportional counters are applied to the X-ray intensity measurements obtained with the electron probe microanalyzer, count rates as high as 50,000 counts/sec can be used.


Counting Rate Electron Probe Dead Time Pulse Height High Counting Rate 
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Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • Kurt F. J. Heinrich
    • 1
  • Donald Vieth
    • 1
  • Harvey Yakowitz
    • 1
  1. 1.National Bureau of StandardsUSA

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