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Generation of a Two-Dimensional Silicon Carbide Lattice

  • R. L. Prickett
  • R. L. Hough
Conference paper

Abstract

Silicon carbide was generated by pyrolysis of gas mixtures consisting of silicon tetrachloride, hydrogen, and organic vapors, such as acetone, on fine tungsten wires resistance-heated at 1500°C. Prominent two-dimensional structure was demonstrated for the 220 reflection. All other lines were of the normal three-dimensional lattice type.

Elevation of less than 100° in the pyrolysis temperature eliminated the two-dimensional reflection, and simultaneously changed the visible crystallite size.

Specialized techniques were used to generate the silicon carbide deposits and also to examine the structure of these deposits by X-ray diffraction to obtain lines from only the silicon carbide while ignoring the tungsten wire core. Diffraction techniques include offset collimation and vertical integration.

Keywords

Silicon Carbide Pyrolysis Temperature Vertical Integration Tungsten Wire Silicon Tetrachloride 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    R. L. Prickett and K. S. Mazdiyasni, “Offset Collimation in Powder Photographs for Increasing Resolution in Unstable Low Symmetry Systems,” paper presented at the American Crystallographic Association meeting, July, 1964.Google Scholar
  2. 2.
    R. L. Prickett and K. S. Mazdiyasni, “Offset Collimator for Use on X-Ray Powder Camera and Method for Increasing Resolution,” U.S. Air Force Invention No. 9743, U.S. Patent Serial No. 380, 959.Google Scholar
  3. 3.
    R. L. Prickett, “Structure Integrating Stress and General Purpose X-Ray Camera,” paper presented at the 21st Pittsburgh Diffraction Conference, November, 1963.Google Scholar
  4. 4.
    R. L. Prickett, J. Fenter, and V. Robinson, “Structure Integrating Stress and General Purpose X-Ray Camera; Combined Long Cylindrical, Laue and Stress Camera for Single Crystal and Orientation Studies with Integration U.S. Air Force Invention No. 9842, U.S. Patent Serial No. 406, 630.Google Scholar
  5. 5.
    R. L. Prickett and R. L. Hough, “Vertical Integrating Attachment,” U.S. patent submitted.Google Scholar
  6. 6.
    G. W. Brindley, K. Robinson, and D. M. C. MacEwan, “The Clay Minerals Halloysite and Meta-halloysite,” Nature 157: 225–226, 1946.CrossRefGoogle Scholar
  7. 7.
    A. Guinier, “Structure of Age-Hardened Aluminium-Copper Alloys,” Nature 142: 569–570, 1938.CrossRefGoogle Scholar
  8. 8.
    S. B. Hendricks, “Variable Structures and Continuous Scattering of X-rays from Layer Silicate Lattices,” Phys. Rev. 57: 448–454, 1940.CrossRefGoogle Scholar
  9. 9.
    S. B. Hendricks and E. Teller, “X-Ray Interference in Partially Ordered Layer Lattices,” J. Chem. Phys. 10: 147–167, 1942.CrossRefGoogle Scholar
  10. 10.
    U. Hofmann and A. Hausdorf, “The Crystal Structure and Intracrystal Swelling of Montmorillonite,” Z. Krist. 104: 265–293, 1942.Google Scholar
  11. 11.
    H. P. Klug and L. E. Alexander, “X-Ray Diffraction Procedures,” John Wiley & Sons, Inc., New York, 1954, p. 385.Google Scholar
  12. 12.
    L. Landau, “Scattering of X-Rays by Crystals with Variable Lamellar Structure,” Physika. Z. Sowjetunion 12: 579–585, 1937.Google Scholar
  13. 13.
    M. V. Laue, “Cross-Lattice Spectra,” Z. Krist. 82: 127–141, 1932.Google Scholar
  14. 14.
    I. M. Lifschits, “Scattering of X-Rays by Crystals of Variable Structure,” Physk. Z. Sowjetunion 12: 623–643, 1937.Google Scholar
  15. 15.
    E. Maegdefrau and U. Hofmann, “The Crystal Structure of Montmorillonite,” Z. Krist. 98: 299–323, 1937.Google Scholar
  16. 16.
    J. Méring, “Interference of X-Rays in Systems with Disordered Stacking,” Acta Cryst. 2: 37 1377, 1949.Google Scholar
  17. 17.
    J. Méring and G. W. Brindley, “Banded X-Ray Reflections from Clay Minerals,” Nature 161: 774, 1948.CrossRefGoogle Scholar
  18. 18.
    H. S. Peiser, H. P. Rooksby, and A. J. C. Wilson, “X-ray Diffraction by Polycrystalline Materials,” The Institute of Physics (London), 1955, p. 418.Google Scholar
  19. 19.
    G. D. Preston, “Structure of Age-Hardened Aluminum-Copper Alloys,” Nature 142: 570, 1938.CrossRefGoogle Scholar
  20. 20.
    B. E. Warren, “X-Ray Diffraction in Random Layer Lattices,” Phys. Rev. 59: 693–698, 1941.CrossRefGoogle Scholar
  21. 21.
    A. J. C. Wilson, “X-Ray Optics,” Methuen & Co., Ltd. (London), 1949.Google Scholar
  22. 22.
    A. J. C. Wilson, “X-Ray Diffraction by Random Layers: Ideal Line Profiles and Determination of Structure Amplitudes from Observed Line Profiles,” Acta Cryst. 2: 245, 1949.CrossRefGoogle Scholar
  23. 23.
    R. L. Hough, “Method for the Pyrolytic Deposition of Silicon Carbide,” U.S. Air Force Invention No. 10, 114.Google Scholar
  24. 24.
    N. W. Thibault, “Morphological and Structural Crystallography and Optical Properties of Silicon Carbide (SiC),” Am. Mineralogist 29: 249–278 and 327–362, 1944.Google Scholar

Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • R. L. Prickett
    • 1
  • R. L. Hough
    • 1
  1. 1.Air Force Materials LaboratoryWright-Patterson Air Force BaseUSA

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