A Camera for Borrmann Stereo X-Ray Topographs

  • F. W. YoungJr.
  • T. O. Baldwin
  • A. E. Merlini
  • F. A. Sherrill


A relatively inexpensive camera which was designed for taking Borrmann topographs with standard X-ray diffraction equipment is described. This camera has been used to take stereo pairs of Borrmann topographs by rotating the crystal around an axis normal to the diffraction planes. Topographs have been taken of nearly perfect copper crystals up to 0.2 cm thick using silver, molybdenum, copper, and chromium radiation, and comparisons have been made with topographs obtained with crystal monochromated radiation. Geometrical factors affecting the resolving power of the technique are briefly reviewed. In addition, the resolution inherent in the diffraction phenomenon is analyzed on the basis of the theory of anomalous transmission. Comparisons are made between calculated and observed image widths of a few dislocations.


Wave Field Stereo Pair Transmitted Beam Diffraction Plane Image Width 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    W. W. Webb, “X-Ray Diffraction Topography,” in: J. B. Newkirk and J. H. Wernick, Direct Observation of Imperfections in Crystals, Interscience Publishers, Inc., New York, 1962, p. 29.Google Scholar
  2. 2.
    A. R. Lang, “X-Ray Diffraction Topography,” in: G. L. Clark, Encyclopedia of X-Rays and Gamma Rays, Reinhold Publishing Corp., New York, 1963, p. 1053.Google Scholar
  3. 3.
    A. Merlini and S. Pace, “Anomalous Transmission in Zinc Crystals,” Nuovo Cimento, Suppl. 1: 531, 1963.Google Scholar
  4. 4.
    M. C. Wittels, F. A. Sherrill, and F. W. Young, Jr., “Anomalous Transmission of X-Rays in Copper Crystals,” Appl. Phys. Letters 2: 127, 1963.CrossRefGoogle Scholar
  5. 5.
    F. W. Young, Jr., F. A. Sherrill, and M. C. Wittels, “Observation of Dislocations in Copper Using Borrmann Transmission Topographs,” J. Appl. Phys. (in press).Google Scholar
  6. 6.
    A. R. Lang, “Studies of Individual Dislocations in Crystals by X-Ray Diffraction Micro-radiography,” J. Appl. Phys. 30: 1748, 1959.CrossRefGoogle Scholar
  7. 7.
    T. S. Noggle, B. F. Day, F. A. Sherrill, and F. W. Young, Jr., “Stereo Images from Borrmann X-Ray Topographs of Copper Crystals,” Bull. Am. Phys. Soc. 10: 324, 1965.Google Scholar
  8. 8.
    K. Haruta, “New Method of Obtaining Stereoscopic Pairs of X-Ray Diffraction Topographs,” J. AppL Phys. 36: 1789, 1965.CrossRefGoogle Scholar
  9. 9.
    B.W. Batterman and H. Cole, “Dynamical Diffraction of X-Rays by Perfect Crystals,”Rev. Mod. Phys 36: 681, 1964Google Scholar
  10. 10.
    R. W. James, “The Dynamical Theory of X-Ray Diffraction,” in: F. Seitz and D. Turnbull Solid State PhysicsVol. 15, Academic Press Inc., New York, 1963, p. 55Google Scholar
  11. 11.
    F. W. Young, Jr. and J. R. Savage, “Growth of Copper Crystals of Low Dislocation Density,” J. Appl. Phys. 35: 1917, 1964.CrossRefGoogle Scholar
  12. 12.
    A. R. Lang and M. Polcarova, “X-Ray Topographic Studies of Dislocations in Iron Silicon Alloy Single Crystals,” Proc. Roy. Soc. (London) Ser. A 285: 297, 1965.CrossRefGoogle Scholar
  13. 13.
    M. C. Wittels, F. A. Sherrill, and A. C. Kimbrough, “A Vertically Rotating Double-Crystal X-Ray Spectrometer,” in: W. M. Mueller, G. Mallett, and M. Fay Advances in X-Ray AnalysisVol. 7, Plenum Press, New York, 1964, p. 265.CrossRefGoogle Scholar
  14. 14.
    U. Bonse, “X-Ray Picture of the Field of Lattice Distortions Around Single Dislocations,” in: J. B. Newkirk and J. H. Wernick Direct Observation of Imperfections in CrystalsInterscience Publishers, Inc., New York, 1962, p. 431.Google Scholar
  15. 15.
    J. Friedel DislocationsPergamon Press, Oxford, 1964, p. 20.Google Scholar

Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • F. W. YoungJr.
    • 1
  • T. O. Baldwin
    • 1
  • A. E. Merlini
    • 1
  • F. A. Sherrill
    • 1
  1. 1.Oak Ridge National LaboratoryOak RidgeUSA

Personalised recommendations