Advances in High-Resolution X-ray Spectrometry

  • E. L. Jossem
Conference paper
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 1)


Some recent advances in technique and interpretation in high-resolution, precision X-ray spectrometry are reviewed. Topics discussed include improvements in X-ray generation and detection systems, the “thickness effect” in X-ray absorption measurements, temporal changes in the spectremetric properties of analyzing crystals, and computational techniques for correcting spectra for instrumental resolving power and for the effects of inner electron states. Applications of these advances to the investigation of the electron energy band structure of solids, to studies of crystal perfection, and to the establishment of precision X-ray wavelength scales are also discussed.


Spectral Window Analyze Crystal Experimental Absorption Spectrum Electron Energy Band Incident Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    L. G. Parratt, Revs. Modern Phys. 31, 616, 1959.CrossRefGoogle Scholar
  2. 2.
    R. Sandström, Arkiv for Fysik 18, 305, 1960. Also see P. Johansson, Arkiv för Fysik 18, 329, 1960.Google Scholar
  3. 3.
    A. Nilsson, Arkiv for Fysik 6, 513, 1953.Google Scholar
  4. 4.
    K. Siegbahn [ed], Beta and Gamma Ray Spectroscopy, Interscience, New York, 1955.Google Scholar
  5. 5.
    R. L. Shacklett, Revs. Modern Phys. 30, 521, 1958.CrossRefGoogle Scholar
  6. 6.
    J. W. M. Dumond, Proc. Nat. Acad. Sci. 45, 1052, 1959.CrossRefGoogle Scholar
  7. 7.
    J. A. Bearden and J. S. Thomsen, A Survey of Atomic Constants, The Johns Hopkins University, Baltimore, 1955.Google Scholar
  8. 8.
    J. Ladell, W. Parrish, and J. Taylor. Acta Cryst. 12, 253, 561, 567, 1959, and references therein.CrossRefGoogle Scholar
  9. 9.
    J. O. Porteus and L. G. Parratt, “Precise Wavelength of a Wide Spectral Line and Precise Lattice Parameter of a Crystal,” Technical Report No. 3, Cornell University, 1959, AFOSR TN 59-305. ASTIA AD 213 089.Google Scholar
  10. 10.
    W. Parrish, Acta Cryst. 12, 992, 1960 and Acta Cryst. 13, 838, 1960.Google Scholar
  11. 11.
    J. O. Porteus, J. Appl. Phys. 33, 700, 1962, and references therein.CrossRefGoogle Scholar
  12. 12.
    E. L. Jossem and P. C. Claspy, Bull. Am. Phys. Soc. Ser. II. 6, 109, 1961.Google Scholar
  13. 13.
    L. G. Parratt, J. O. Porteus, H. W. Schnopper, and T. Watanabe, Rev. Sci. Instr. 30, 344, 1959.CrossRefGoogle Scholar
  14. 14.
    L. G. Parratt, C. F. Hempstead, and E. L. Jossem, Phys. Rev. 105, 1228 1957.CrossRefGoogle Scholar
  15. 15.
    K. Tsutsumi, M. Obashi, and M. Sawada, J. Phys. Soc. Japan 13, 43, 1958.CrossRefGoogle Scholar
  16. 16.
    O. Beekman, B. Axelsson, and P. Bergvall, Arkiv for Fysik 15, 567, 1959.Google Scholar
  17. 17.
    P. Johansson, Arkiv for Fysik 18, 289, 1960.Google Scholar
  18. 18.
    P. O. Schörling, Arkiv for Fysik 19, 47, 1961.Google Scholar

Copyright information

© Society for Applied Spectroscopy 1962

Authors and Affiliations

  • E. L. Jossem
    • 1
  1. 1.Department of Physics and AstronomyThe Ohio State UniversityColumbusUSA

Personalised recommendations