Advances in High-Resolution X-ray Spectrometry

  • E. L. Jossem
Conference paper
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 1)


Some recent advances in technique and interpretation in high-resolution, precision X-ray spectrometry are reviewed. Topics discussed include improvements in X-ray generation and detection systems, the “thickness effect” in X-ray absorption measurements, temporal changes in the spectremetric properties of analyzing crystals, and computational techniques for correcting spectra for instrumental resolving power and for the effects of inner electron states. Applications of these advances to the investigation of the electron energy band structure of solids, to studies of crystal perfection, and to the establishment of precision X-ray wavelength scales are also discussed.


Spectral Window Analyze Crystal Experimental Absorption Spectrum Electron Energy Band Incident Spectrum 


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Copyright information

© Society for Applied Spectroscopy 1962

Authors and Affiliations

  • E. L. Jossem
    • 1
  1. 1.Department of Physics and AstronomyThe Ohio State UniversityColumbusUSA

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