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On-Line Process Analysis by X-ray Emission Techniques

  • W. F. Loranger
Conference paper
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 1)

Abstract

Instrumentation designed to utilize the principles of X-ray emission optics will produce an output signal proportional to the amount of an element present in a material, whether the material is stationary or moving. Such instrumentation, therefore, is very well suited for continuous analysis of elements in a material flowing in a process line.

Keywords

Physical Chemistry Output Signal General Electric Data Logger Emission Optic 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Society for Applied Spectroscopy 1962

Authors and Affiliations

  • W. F. Loranger
    • 1
  1. 1.General Electric Co.MilwaukeeUSA

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