On-Line Process Analysis by X-ray Emission Techniques

  • W. F. Loranger
Conference paper
Part of the Developments in Applied Spectroscopy book series (DAIS, volume 1)


Instrumentation designed to utilize the principles of X-ray emission optics will produce an output signal proportional to the amount of an element present in a material, whether the material is stationary or moving. Such instrumentation, therefore, is very well suited for continuous analysis of elements in a material flowing in a process line.


Physical Chemistry Output Signal General Electric Data Logger Emission Optic 
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Copyright information

© Society for Applied Spectroscopy 1962

Authors and Affiliations

  • W. F. Loranger
    • 1
  1. 1.General Electric Co.MilwaukeeUSA

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