Recording and Energy Analysis of Low-Energy H1+, H2+, and He+ Ions by Means of Surface-Barrier Silicon Counters

  • G. F. Bogdanov
  • M. M. Dremin
  • B. P. Maksimenko


Surface-barrier silicon counters have opened new possibilities of recording and analyzing charged and neutral particles emitted from a plasma [1, 2]. In the majority of cases, the energies of these particles do not exceed several tens of kiloelectronvolts. The H 1 + -ion energy below which the probability for the formation of an electron-hole pair in silicon is negligibly small amounts to about 0.25 keV (about 1 keV for He++) [3]. Therefore, in principle, the energy threshold of counters used for the spectrometric analysis of particles is determined by the losses in the insensitive counter “window” and by the statistical fluctuations of the number of electron-hole pairs created by a single particle. The energy threshold can be very low (1–2 keV for H 1 + ions).


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Copyright information

© Consultants Bureau, New York 1971

Authors and Affiliations

  • G. F. Bogdanov
  • M. M. Dremin
  • B. P. Maksimenko

There are no affiliations available

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