Effect of Doping on Defect Structure and Phase Stability in Y-Based Cuprates: In-Situ Tem Studies
Transmission electron microscopy (TEM) studies of defect structure in YBa2Cu3−xMxOy doped with Mg and Zn (M = Mg, Zn) are reported. The Mg doped material exhibited a large number of non-intersecting <110> twins. In-situ heat pulsing experiments in the TEM showed that only one of the twin variants was unstable to annealing. It was also found that other types of planar defects may replace the disappearance of one of the twin variants. The Zn doped material on the other hand showed remarkable microstructural stability to the in-situ heating experiments. It is suggested that these results may be interpreted in terms of preferential site occupancy of dopants at twin boundaries.
KeywordsTwin Boundary Vacant Site Heating Experiment Twin Plane Transmission Electron Microscopy Technique
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