Studies of Microstructures in High-Tc Superconductors by X-ray Absorption Techniques
Fluorescence emission and total-electron-yield vs. grazing angle of incidence at fixed energy of incoming soft x-ray radiation, around O is absorption edge, for YBa2Cu3O7−δ and Bi2Sr2 CaCu2O8+x thin films on MgO and ZrO2substrates were investigated. Surface rms roughness and oxygen depth distribution were estimated. We have found that in these materials the information depth of microstructures derived from fluorescence yield and total-electron-yield is around 2500 Å and 100 Å, respectively.
Unable to display preview. Download preview PDF.
- 1.A. Krol, C.J. Sher, and Y.H. Kao, Phys. Rev. B39:8579 (1988).Google Scholar
- 2.H. Sugiyama, Jap. Bull. Electr. Lab. 38:351 (1974).Google Scholar
- 3.B.K. Agrawal “X-Ray Spectroscopy” ed., Springer-Verlag, New York (1979).Google Scholar
- 4.G.C. Smith, A. Krol, and Y.H. Kao, to be published in Nucl. Instr. Meth.Google Scholar