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Focusing High Pressure X-ray Diffraction Camera

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Abstract

Several techniques have been developed to obtain x-ray powder diffraction data at high pressures. Reviews of different techniques currently utilized have been given by Bradley [1] and McWhan [2]. Amorphous boron is often used as the gasket material between Bridgman anvils of sintered tungsten carbide [3]. The x-ray system can be of either Debye-Scherrer or Guinier geometry [4–7], preferably with MoKα-radiation. Constructions have been described where the whole press frame and the anvil assembiy can be oscillated [4], but in general the diffraction equipment is designed for fixed samples.

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References

  1. C. C. Bradley, High Pressure Methods in Solid State Research, Butterworths, London (1969).

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  2. D. B. McWhan, Trans. Am. Cryst. Assoc. 5., 39 (1969).

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  3. J. C. Jamieson and A. W. Lawson, J. Appl. Phys. 33, 776 (1962).

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  4. D. B. McWhan and W. L. Bond, Rev. Sei. Instr. 35, 626 (1964).

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  5. D. B. McWhan, ASME Publication 64-WA/PT-22, New York (1964).

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  6. T. N. Kolobyanina, S. S. Kabalkina, L. F. Vereshchagin, M. F. Kachan, and V. G. Losev, High Temp.-High Press. 4, 207 (1972).

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  7. J. Singh, Rev. Sei. Instr. 45, 1475 (1974).

    Article  Google Scholar 

  8. R. E. Scott, Rev. Sei. Instr. 35, 118 (1964).

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  9. D. L. Decker, W. A. Bassett, L. Merrill, H. T. Hall, and J. D. Barnett, J. Phys. Chem. Ref. Data 11, 773 (1972).

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  10. J. C. Jamieson and D. B. McWhan, J. Chem. Phys. 43, 1149 (1965).

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  11. S. S. Kabalkina, L. F. Vereshchagin, and B. M. Shulenin, JETP, 45, 2073 (1962); also Soviet Phys. JETP 18, 1422 (1964).

    Google Scholar 

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© 1979 Springer Science+Business Media New York

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Hägg, G., Engström, I., Törmä, B. (1979). Focusing High Pressure X-ray Diffraction Camera. In: Timmerhaus, K.D., Barber, M.S. (eds) High-Pressure Science and Technology. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7470-1_117

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  • DOI: https://doi.org/10.1007/978-1-4684-7470-1_117

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-7472-5

  • Online ISBN: 978-1-4684-7470-1

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