Abstract
For the measurement of residual stresses, X-ray diffraction is potentially the best nondestructive method available. Experiments are described in which silicon bronze and α-brass samples were examined by X-rays while subjected to tensile deformation. The positions of the diffraction lines and their breadths were measured and analyzed. The special features of the experimental arrangement employed are presented and the method of analysis explained.
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© 1965 Plenum Press
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Otte, H.M., Esquivel, A.L., Lauer, W.E. (1965). Measurement of Applied Stress by X-Ray Diffraction. In: Otte, H.M., Locke, S.R. (eds) Materials Science Research. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7450-3_6
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DOI: https://doi.org/10.1007/978-1-4684-7450-3_6
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-7452-7
Online ISBN: 978-1-4684-7450-3
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