Measurement of Applied Stress by X-Ray Diffraction
For the measurement of residual stresses, X-ray diffraction is potentially the best nondestructive method available. Experiments are described in which silicon bronze and α-brass samples were examined by X-rays while subjected to tensile deformation. The positions of the diffraction lines and their breadths were measured and analyzed. The special features of the experimental arrangement employed are presented and the method of analysis explained.
KeywordsResidual Stress Apply Stress Tensile Specimen Peak Shift Diffraction Line
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- 1.R. F. Thomson, “Engineering Interest in Internal Stresses,” in: Internal Stresses and Fatigue in Metals, edited by G. M. Rassweiler and W. L. Grube, Elsevier Publishing Co., Amsterdam, 1959, pp. 3 - 14.Google Scholar
- 2.C. S, Barrett, “Scientific Interest in Internal Stresses,” in: Internal Stresses and Fatigue in Metals, edited by G. M. Rassweiler and W. L. Grube, Elsevier Publishing Co., Amsterdam, 1959, pp. 15 – 40.Google Scholar
- 15.H. M. Otte and H. Chessin, (to be published).Google Scholar
- 24.R. P. I. Adler, Doctoral thesis, Yale University, 1964.Google Scholar