The Use of Changes in X-Ray Diffraction Line Broadening to Study Recovery Kinetics in Pure Cobalt
X-ray diffraction line profile techniques have become sufficiently refined to give a detailed description of cold-worked structures. Local strain, small particle size, and stacking faults cause a broadening of the diffraction lines. Some profiles are broadened by all three, while others are influenced only by local strain and small particle size. These techniques were used to investigate recovery phenomena in samples of hexagonal cobalt.
KeywordsLocal Strain Small Particle Size Growth Fault Transformation Strain Integral Breadth
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