Secondary Electron Emission from the Surface of Germanium and Silicon on Bombardment with Alkali Ions
The secondary electron emission arising as a result of the bombardment of solids with ions has been widely studied in recent years. Reliable data have been obtained as regards the true nature of these phenomena and their dependence on the many parameters of the incident ions and metal targets [1–10]. Two mechanisms governing the emission have become sharply distinguished, namely, those associated with the kinetic and potential energies of the incident ions ; the dependence of the corresponding coefficients on the energy and nature of the bombarding ions has been studied in detail [1, 4, 5], and a specific relationship has been established between the coefficients of ion-electron emission and the crystallographic structure of the irradiated surface. Considerable attention has been paid to the part played by the mass and velocity of the incident ions [1–3]. For this purpose the coefficients of secondary ion-electron emission have been determined over a wide range of ion masses and the so-called isotopic effect has been studied by bombarding the same target with ions of two isotopes of the same element. For the majority of the ions and targets studied, it has been established that the efficiency of the ejection of electrons increases with falling mass of the incident ion for the same ion energies. It has been shown that, over a wide range of masses, the velocity of the ion is by no means the only factor determining the efficiency of electron ejection [1, 7]. In certain cases the isotopic effect has indicated a pure velocity dependence, although deviations have still occurred ; these results referred only to cases in which the masses of the incident particles were smaller than those of the target atoms.
KeywordsIsotopic Effect Incident Particle Target Atom Metal Target Alkali Halide
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