On the Isotopic Effect Associated with Kinetic Ion-Electron Emission
Secondary-electron emission takes place in addition to other phenomena when a stream of fast charged or neutral particles strikes a solid surface. The emission of electrons from a solid may occur as a result of either the potential or the kinetic energy of the incident particles. The kinetic emission of electrons has been insufficiently studied. Up to the present time there has been no concerted opinion as to the way in which the nature of the incident particle affects electron emission, nor as to the part played by the crystal structure or work function of the target. An analysis of experimental data obtained for the secondary-emission coefficient indicates that this quantity varies in a complicated manner with the mass and state of charge of the irradiating particle. In a number of investigations, the dependence of this characteristic on the mass of the incident ion has been studied in “pure” form by using isotopic ions of one and the same substance; the influence of the structure of the electron shells in the ions on the coefficient γ is thus excluded.
KeywordsIsotopic Effect Silicon Single Crystal Incident Particle Potential Emission Kinetic Emission
Unable to display preview. Download preview PDF.
- 1.W. Ploch and Walcher, Rev. Sci. Inst., Vol. 22, No. 12 (1951).Google Scholar
- 2.I. P. Flaks, Author’s abstract of Candidate’s Dissertation, Leningrad Pedagogical Institute (1954).Google Scholar
- 4.U. A. Arifov, R. R. Rakhimov, M. K. Abdullaeva, and C. Gaipov, Izv. Akad. Nauk SSSR, Ser. Fiz., 26, 1103, 11 (1962).Google Scholar
- 5.Finkelstein, Rev. Sci. Inst., 11:94 (1940).Google Scholar
- 8.R. R. Rakhimov, Author’s abstract of Candidate’s Dissertation, Tashkent (1958).Google Scholar
- 10.K. Heiland, Usp. Fiz. Nauk, Vol. 89, No. 4 (1965).Google Scholar
- 11.I. A. Davies et al., Canad. J. Chem., Vol. 39 (1961).Google Scholar