Abstract
A standing wave with an evanescent electromagnetic field in the rarer medium is established normal to the reflecting surface for total internal reflection. Optical spectra of materials can be obtained by measuring the interaction of this evanescent field with an absorbing rarer medium. This spectroscopy technique, called Internal Reflection Spectroscopy, can be employed in many instances where conventional either fail or cannot easily be employed. Examples of these are the recording of the spectra of monomolecular films and powdered samples. By placing appropriate resonant thin films (optical cavities) on the reflecting surface, strongly amplified fields, analogous to that obtained in microwave cavities are established, and enhanced absorptions are obtained. In addition to a brief review of Internal Reflection Spectroscopy, the principles and applications of these optical cavities will be discussed as well as other methods for enhancing the sensitivity.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1968 Plenum Press
About this chapter
Cite this chapter
Harrick, N.J. (1968). Enhanced Sensitivity for Internal Reflection Spectroscopy. In: Wendlandt, W.W. (eds) Modern Aspects of Reflectance Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7182-3_14
Download citation
DOI: https://doi.org/10.1007/978-1-4684-7182-3_14
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-7184-7
Online ISBN: 978-1-4684-7182-3
eBook Packages: Springer Book Archive