Skip to main content

Enhanced Sensitivity for Internal Reflection Spectroscopy

  • Chapter
Book cover Modern Aspects of Reflectance Spectroscopy

Abstract

A standing wave with an evanescent electromagnetic field in the rarer medium is established normal to the reflecting surface for total internal reflection. Optical spectra of materials can be obtained by measuring the interaction of this evanescent field with an absorbing rarer medium. This spectroscopy technique, called Internal Reflection Spectroscopy, can be employed in many instances where conventional either fail or cannot easily be employed. Examples of these are the recording of the spectra of monomolecular films and powdered samples. By placing appropriate resonant thin films (optical cavities) on the reflecting surface, strongly amplified fields, analogous to that obtained in microwave cavities are established, and enhanced absorptions are obtained. In addition to a brief review of Internal Reflection Spectroscopy, the principles and applications of these optical cavities will be discussed as well as other methods for enhancing the sensitivity.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1968 Plenum Press

About this chapter

Cite this chapter

Harrick, N.J. (1968). Enhanced Sensitivity for Internal Reflection Spectroscopy. In: Wendlandt, W.W. (eds) Modern Aspects of Reflectance Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7182-3_14

Download citation

  • DOI: https://doi.org/10.1007/978-1-4684-7182-3_14

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-7184-7

  • Online ISBN: 978-1-4684-7182-3

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics