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Product Specifications and Manufacturing Process Tolerances

  • Sammy G. Shina

Abstract

The process capability index C p is gaining acceptance as a measure of product design for manufacturing, especially in the process-intensive industries such as IC and PCB fabrication. Historically, it has been one of the earliest methods of measuring design for manufacture by forecasting the reject rates in production of new components, assemblies, and products. Its unique blend of the production variability versus design specification makes it a natural method for setting, communicating, and comparing new product specifications and manufacturing quality levels for competitive manufacturing plants.

Keywords

Control Chart Print Circuit Board Process Capability Control Limit Defect Rate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Van Nostrand Reinhold 1991

Authors and Affiliations

  • Sammy G. Shina
    • 1
  1. 1.University of LowellUSA

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