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Noise Limits in Detector Charge Measurements

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Techniques and Concepts of High-Energy Physics VI

Part of the book series: NATO ASI Series ((NSSB,volume 275))

Abstract

The noise in the front-end amplifiers sets a serious limitation in the accuracy of charge measurements with detectors that have no internal multiplication like gaseous, liquid and solid state ionisation chambers, solid state strip and pixel detectors and silicon drift chambers. The present paper, after discussing the limits set by noise and reviewing the noise properties of front-end components, analyzes the perspectives opened up by modern device and circuit technologies in low-noise detector applications. Particular attention will be devoted to the situations arising in elementary particle experiments of both accelerator and non-accelerator nature.

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Author information

Authors and Affiliations

  1. Dipartimento di Elettronica, Università di Pavia, Via Abbiategrasso 209, 27100, Pavia, Italy

    P. F. Manfredi

  2. Istituto Nazionale di Fisica Nucleare, Via Celoria 16, 20133, Milano, Italy

    V. Speziali

  3. Instrumentation Division, Brookhaven National Laboratory, 11973, Upton, N.Y., USA

    P. F. Manfredi

Authors
  1. P. F. Manfredi
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  2. V. Speziali
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Editor information

Editors and Affiliations

  1. University of Rochester, Rochester, New York, USA

    Thomas Ferbel

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© 1991 Plenum Press, New York

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Manfredi, P.F., Speziali, V. (1991). Noise Limits in Detector Charge Measurements. In: Ferbel, T. (eds) Techniques and Concepts of High-Energy Physics VI. NATO ASI Series, vol 275. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-6006-3_7

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  • DOI: https://doi.org/10.1007/978-1-4684-6006-3_7

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-6008-7

  • Online ISBN: 978-1-4684-6006-3

  • eBook Packages: Springer Book Archive

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