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Noise Limits in Detector Charge Measurements

  • P. F. Manfredi
  • V. Speziali
Part of the NATO ASI Series book series (NSSB, volume 275)

Abstract

The noise in the front-end amplifiers sets a serious limitation in the accuracy of charge measurements with detectors that have no internal multiplication like gaseous, liquid and solid state ionisation chambers, solid state strip and pixel detectors and silicon drift chambers. The present paper, after discussing the limits set by noise and reviewing the noise properties of front-end components, analyzes the perspectives opened up by modern device and circuit technologies in low-noise detector applications. Particular attention will be devoted to the situations arising in elementary particle experiments of both accelerator and non-accelerator nature.

Keywords

Spectral Density Input Device Bipolar Transistor Gate Width Charge Measurement 
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Copyright information

© Plenum Press, New York 1991

Authors and Affiliations

  • P. F. Manfredi
    • 1
    • 3
  • V. Speziali
    • 2
  1. 1.Dipartimento di ElettronicaUniversità di PaviaPaviaItaly
  2. 2.Istituto Nazionale di Fisica NucleareMilanoItaly
  3. 3.Instrumentation DivisionBrookhaven National LaboratoryUptonUSA

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