Abstract
Photoelectron spectroscopy is one of the most powerful tools in order to analyse the electronic structure of matter. It has been extensively applied to the gas, liquid and solid state phases [1, 2, 3, 4]. Depending on the energy of the incoming photons and the detection mode of the emitted photoelectrons detailed information on the core electrons, dispersion relation E(k) of valence electrons, spin polarisation, local (site decomposed) and partial (angular momentum decomposed) density of electronic states (DOS) can be obtained. From these data many other properties can be determined: elemental composition, chemical state, depth and laterally resolved composition, structural information, Fermi level position, workfunction, magnetic moment and state density of the Fermi energy (E F). The latest developments include the observation of the energy gap in high Tc superconductors [5] and the application of photoelectron diffraction [6].
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
In M. Cardona and L. Ley, editors, Photoemission in Solids I and II,Springer, (1985).
In D. Briggs and M. P. Seah, editors, Practical Surface Analysis,Wiley and Sons, (1983).
P. Oelhafen. In E. Löscher, G. Fritsch, and G. Jacucci, editors, Amorphous and Liquid Materials, page 333, Martinus Nijhoff Publishers, Dordrecht, Boston, Lancaster, (1987).
G. Indlekofer and P. Oelhafen. In M. Borrisov, N. Kirov, and A. Vavrek, editors, Disordered Systems and New Materials, page 707, World Scientific Publishing Co., Singapore, (1989).
J. M. Imer, F. Patthey, B. Dardel, W. D. Schneider, Y. Baer, Y. Petroff, and A. Zettl. Phys. Rev. Letters 62, 336 (1989).
J. Osterwalder, T. Greber, S. Hüfner, and L. Schlapbach. Phys. Rev. Letters 64, 2683 (1990).
M. P. Seah and W. A. Dench. Surface and Interface Analysis 1, 2 (1979).
P. Oelhafen and D. Ugolini. In P. Koidl and P. Oelhafen, editors, Amorphous Hydrogenated Carbon Films, page 267, Les Editions de Physique, Les Ulis (France), (1987).
H. R. Kaufman. J. Vac. Sci. and Technol. 15, 272 (1978).
S. Schelz, J. Eitle, R. Steiner, and P. Oelhafen. (1990). Contribution to ICSFS-5 conference.
R. Zehringer, H. Künzli, P. Oelhafen, and C. Hollenstein. J. Nucl. Mat. (1990). in press.
A. Bianconi, S. B. M. Hagström, and Bachrach R. Z. Phys. Rev. B 16, 5543 (1977).
F. R. McFeely, S. P. Kowlczyk, L. Ley, R. G. Cavall, R. A. Pollak, and D. A. Shirley. Phys. Rev. 13 9, 5268 (1974).
F. J. Ilimpsel, J. F. van der Veen, and 1). E. Eastman. Phys. Rev. B 22, 1967 (1980).
F. C. Chalkin. Proc. Royal Soc. A 194, 42 (1948).
Chr. Beyreuther, R. Hierl, and G. Wiech. Ber. Bunsen ges. Phys. Chem. 79, 1081 (1977).
G. Wiech and E. Zöpf. Electronic Density of States, chapter, page 335. Natl. Bur. Stand. Publ. 323, US GPO, Washington D. C., (1969).
J. Fink, T. Müller-Heinzerling, J. Pfluger, A. Bubenzer, P. Koidl, and G. Greceling. Solid State Commun. 47, 887 (1983).
P. Oelhafen, J.L. Freeouf, J.M.E. Harper, and J.J. Cuomo. Thin Solid Films 120, 231 (1984).
C. Weissmantel, K. Bewilogua, D. Dietrich, H. J. Erler, H. J. Hinneberg, S. Klose, W. Nowick, and G. Reisse. Thin Solid Films 72, 19 (1980).
D. Ugolini, M. H. Tuilier, J. Eitle, J.Q. Wang, and P. Oelhafen. Appl. Phys. A (1990). in press.
P. Oelhafen and D. Ugolini. In P. Koidl and P. Oelhafen, editors, Amorphous Hydrogenated Carbon Films, page 137, Les Editions de Physique, Les Ulis (France), (1987).
D. Ugolini, P. Oelhafen, and M. Wittmer. In P. Koidl and P. Oelhafen, editors, Amorphous Hydrogenated Carbon Films, page 287, Les Editions de Physique, Les Ulis (France), (1987).
D. Ugolini, P. Oelhafen, and M. Wittmer. In P. Koidl and P. Oelhafen, editors, Amorphous Hydrogenated Carbon Films, page 297, Les Editions de Physique, Les Ulis (France), (1987).
D. Ugolini, J. Eitle, P. Oelhafen, and M. Wittmer. Appl. Phys. A 48, 549 (1989).
M. Wittmer, D. Ugolini, J. Eitle, and P. Oelhafen. Appl. Phys. A. 48, 559 (1989).
M. Wittmer, D. Ugolini, and P. Oelhafen. J. Electrochem. Soc. (1989). accepted for publication.
C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder, and G. E. Mullenberg. Eden Prairie, Perkin Elmer Corporation, (1979).
L. Ley, R. A. Pollak, F. R. McFeely, S. D. Kowalczyk, and D. A. Shirley. Phys. Rev. B 9, 600 (1974).
W. Ranke and K. Jacobi. Nog. Surf. Sei. 10, 1 (1981). and references therein.
F. A. Shunk. Constitution. of Binary Alloys. Mc Graw-Hill, New York, (1985).
M. G. Crescenzi, P. Picozzi, S. Santucci, C. Battistoni, and G. Mattogo. Solid State Commun. 51, 811 (1983).
M. G. Mason. Phys. Rev. B 27, 748 (1983).
I). Ugolini, J. Eitle, and P. Oelhafen. Vacumn (1990). in press.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1991 Plenum Press, New York
About this chapter
Cite this chapter
Oelhafen, P., Ugolini, D., Schelz, S., Eitle, J. (1991). Electron Spectroscopy on Carbon Based Films: Bulk and Interface Properties. In: Clausing, R.E., Horton, L.L., Angus, J.C., Koidl, P. (eds) Diamond and Diamond-like Films and Coatings. NATO ASI Series, vol 266. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5967-8_24
Download citation
DOI: https://doi.org/10.1007/978-1-4684-5967-8_24
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-5969-2
Online ISBN: 978-1-4684-5967-8
eBook Packages: Springer Book Archive