Abstract
The effects of the:
-
1.
variation of the Si-O and Al-O distances depending on bonding forces on T and O atoms
-
2.
variation of the measured T-O distances depending on disorder in the (Si,Al) distribution
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3.
variation of the measured T-O distances depending on the temperature of the diffraction data collection
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4.
shortening of the measured T-O distances as a result of averaging when apparent symmetry is higher than true symmetry
on the determination of the Al-content in the tetrahedral sites of zeolites has been shown. All these effects have a remarkable influence on the calculated Al-fraction. The differences in the (Si,Al) distribution found by comparing the results of a method proposed by Alberti and Gottardi1, which takes into account effects no. 1 and no. 2, and of Jones’2 determinative curve are stressed.
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© 1990 Plenum Press, New York
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Alberti, A., Gottardi, G., Lai, T. (1990). The Determination of (Si,Al) Distribution in Zeolites. In: Barthomeuf, D., Derouane, E.G., Hölderich, W. (eds) Guidelines for Mastering the Properties of Molecular Sieves. NATO ASI Series, vol 221. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5787-2_8
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DOI: https://doi.org/10.1007/978-1-4684-5787-2_8
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