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A Robust Detection Algorithm Using Frequency Diverse Multiple Observations

  • Jian-qiang Xin
  • Xing Li
  • Nihat M. Bilgutay
  • Kevin D. Donohue
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

The detection of a flaw embedded in large-grained material using high-resolution broadband ultrasonic pulses is hindered by high amplitude interfering echoes (speckle) due to the unresolvable grain boundaries. The application of an optimal linear processor in this case is complicated by the fact that statistical parameters of the grain noise are not known a priori.

Keywords

Stainless Steel Sample Frequency Increment Clutter Suppression Peak Coincidence Automatic Parameter Selection 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    P. M. Shankar, U. Bencharit, N. M. Bilgutay, and J. Saniie, ‘Grain noise suppression through bandpass filtering’, Materials Evaluation, Vol.46,pp. 1100–04, No. 8, July 1988.Google Scholar
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    N. M. Bilgutay, and J. Saniie, ‘The effect of grain size on flaw visibility enhancement using split-spectrum processing’, Materials Evaluation, Vol. 42, pp. 808–814, May 1984.Google Scholar
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    V. L. Newhouse, N.M. Bilgutay, J. Saniie, and E. S. Furgason, ‘Flaw-to-grain echo enhancement by split-spectrum processing’, Ultrasonics, Vol. 20, No. 2, pp. 59–68, Mar. 1982.CrossRefGoogle Scholar
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    X. Li, N. M. Bilgutay, and J. Saniie, ‘Frequency diverse statistical filtering for clutter suppression’, Proceedings of the IEEE 1989 International Conference on Acoustics, Speech, and Signal Processing, pp. 1349–52, 1989.Google Scholar
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    J.W. Goodman„ Statistical Optics, John Wiley & Sons, Inc., New York, 1985.Google Scholar
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Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • Jian-qiang Xin
    • 1
  • Xing Li
    • 1
  • Nihat M. Bilgutay
    • 1
  • Kevin D. Donohue
    • 1
  1. 1.Department of Electrical and Computer EngineeringDrexel UniversityPhiladelphiaUSA

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