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A New Technique for Sizing Cracks in Metals, Utilizing an Induced Surface Magnetic Field

  • S. H. H. Sadeghi
  • D. Mirshekar-Syahkal
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

The new technique, introduced in this paper, has originated in the course of development of an inducing mechanism for use with the ac field measurement instrument used in detection and sizing of cracks in metals[t]. It had been known for some time that the application of an inducing mechanism capable of producing the required uniform field over the surface of the metal would add to the advantages of the ac field measurement (ACFM) technique[1,2]. This led to some activities in identifying current carrying structures which can fulfil this requirement. One structure proposed consists of two parallel wires forming a U shape which can be readily integrated with the ACFM probe, Fig.l. In practice, in order to maintain the original characteristic of the induced surface field produced by this inducing arrangement, the feeding terminals and the related wiring should be located adequately far from the metal surface.

Keywords

Crack Edge Crack Depth Incident Field Surface Field Induce Mechanism 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    R. Collins, W. D. Dover and D. H. Michael, in Research Techniques in Nondestructive Testing, Vol. VIII, R. S. Sharpe, ed., pp. 211–267, Academic Press, London, 1985.Google Scholar
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    R. Collins, D. Mirshekar-Syahkal and D. H. Michael, in Review of Progress in Quantitative Nondestructive Evaluation, D. O. Thompson and D. E. Chimenti, eds., pp. 1255–1268, Plenum Press, New York, 1983.CrossRefGoogle Scholar
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    Edward C. Jordan and Keith G. Balmain, Electromagnetic Waves and Radiating Systems, Prentice-Hall, New York 1969.Google Scholar
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    R. O. McCray, D. W. Oliver, K. H. Silverstein and J. D. Young, IEEE Trans. in Magnetics, Vol. Mag-20, No.5, pp. 1986–1988, 1984.Google Scholar
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    D. H. Michael, R. T. Waechter and R. Collins, Proc. R. Soc. A381, pp. 139–157, 1982.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • S. H. H. Sadeghi
    • 1
  • D. Mirshekar-Syahkal
    • 1
  1. 1.Dept. of Electronic Systems EngineeringUniversity of EssexColchesterUK

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