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An Eddy Current Method for Flaw Characterization from Spatially Periodic Current Sheets

  • Satish M. Nair
  • James H. Rose
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

Early NDE research primarily focused on the ability to develop techniques which could detect flaws in structures. Eddy currents, induced by exciting coil probes placed over a structure, were found to be a valuable tool in detecting flaws in conducting materials. In recent years, efforts have been expanded from the detection of defects to a more quantitative characterization of flaws. In metallic structures, the important flaw characteristics consist of the flaw’s depth, position, size, shape, and material properties (flaw electrical conductivity, magnetic permeability etc.). This paper continues our efforts of the past two years to recover flaw characteristics from eddy current data.

Keywords

Inverse Fourier Transform Integration Contour Harmonic Frequency Impedance Change Inversion Procedure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    S. M. Nair, J. H. Rose, and V. G. Kogan, in Review of Progress in Quantitative NDK, edited by D. O. Thompson and D. E. Chimenti, ( Plenum Press, New York, 1988 ), Vol. 7A, pp. 461–469.Google Scholar
  2. 2.
    S. M. Nair and J. H. Rose, in Review of Progress in Quantitative NDE, edited by D. O. Thompson and D. E. Chimenti, ( Plenum Press, New York, 1989 ), Vol. 8A, pp. 313–320.Google Scholar
  3. 3.
    B. A. Auld, F. G. Muennemann, and M. Riaziat, in Research Techniques in Nondest,rurtive Testing, Vol. 7, edited by R. S. Sharpe (Academic Press, London, 1984), Ch. 2.Google Scholar
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    W. S. Dunbar, J. of Nondestructive Evaluation, Vol. 7, Nos. 1/2, 43(1988).Google Scholar
  5. 5.
    R. L. Stoll, The analysis of eddy currents ( Clarendon Press, Oxford, 1974 ).Google Scholar
  6. 6.
    S. M. Nair and J. H. Rose, unpublished.Google Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • Satish M. Nair
    • 1
  • James H. Rose
    • 1
  1. 1.Center for NDEIowa State UniversityAmesUSA

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