IR Spectroscopy for Bonding Surface Contamination Characterization
Organic contaminants such as hydrocarbons and silicones that may be present on bonding surfaces are known to degrade bond strength when cured into the bondline. In-situ characterization of bonding surface contamination is desirable but is somewhat limited by available techniques. Optically Stimulated Electron Emission (OSEE) has been developed and used for qualitative detection of contaminants on some types of surfaces (primarily metals) and infrared (IR) spectroscopy is conventionally used for laboratory evaluation of contamination samples wiped from a bonding surface and dissolved in a solvent. This paper presents an IR external reflection spectroscopy imaging technique for in-situ bonding surface contamination detection and characterization. Methods for optimizing sensitivity to thin organic films are discussed. A discussion of the use of this technique for imaging grease contamination on composite substrate materials is given.
KeywordsElectric Field Intensity Bonding Surface Electric Field Vector Parallel Polarization Electric Field Amplitude
Unable to display preview. Download preview PDF.