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Eddy Current Imaging of Aircraft Using Real Time Image Signal Processing

  • M. W. Kirby
  • J. P. Lareau
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

The increased incidence of aircraft component failures as motivated a reassessment of the NDE methods applied to assure fleet airworthiness. In the past, eddy current testing has been limited by the presence of spurious signals, operator error and the lack of permanent test results. An eddy current system using portable precision scanners and signal analysis techniques developed in the nuclear industry has been applied to aircraft inspections. Using custom designed probes, multifrequency mixing, and digital signal processing, the detection criteria of 10% loss of wall on the interior faying surface and cracks 60 mils (1.5 mm) in length have been accomplished. The subtle nature of these flaw conditions and the presence of interfering signals prompted the need for signal processing techniques. To achieve this objective, real time signal processing that requires a minimum of computation has been implemented in an eddy current C-scan imaging system. The signal processing produces spatial displays of amplitude (in phase or quadrature), magnitude, phase of spatial derivatives of these parameters. Permanent images that are more easily interpretable for flaw detection are thus produced.

Keywords

Wall Loss Eddy Current Testing Absolute Probe Commercial Airline Real Time Signal Processing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Aging Aircraft“, DeMeis, Richard, Aerospace America, July, 1989.Google Scholar
  2. 2.
    Signal Processing for Steam Generator Inspection, Jackson, P. S., Endter, R. K., Sapia, M. A., and Lareau, J. P., Electric Power Research Institute Publication NP-5773, April, 1988.Google Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • M. W. Kirby
    • 1
  • J. P. Lareau
    • 1
  1. 1.AMDATA, INC.WindsorUSA

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