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Detection of Coating Adhesion Defects Using Fast Infrared Scanning Technique

  • Jari Hartikainen
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

In the past ten years a variety of thermal wave nondestructive measurement systems have been developed but most of them are too slow, fragile or expensive in order to be applied in industry. The standard approach to increase the measurement speed has been to apply a uniform heat pulse and to monitor c he surface temperature with an infrared camera [1]. However, in many practical situations the full speed of an infrared camera is not really needed and thus a moving line source can be used for heating and the surface temperature rise can be detected with a one dimensional infrared scanner without a significant increase in inspection time. This approach has several benefits including:
  • simple and inexpensive hardware

  • no dead time between heat pulse and temperature detection

  • peak heating power can be reduced by an order of magnitude compared to area heating and so simple and cheap heating system can be used, and

  • readily applicable to the on-line inspection of moving samples.

Keywords

Infrared Camera Heat Pulse Thermal Contact Resistance Line Heat Source Surface Temperature Rise 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    W.N. Reynolds, Can. J. Phys. 64, 1150 (1986)CrossRefGoogle Scholar
  2. 2.
    J. Hartikainen, Rev. Sci. Instr. 60, 670 (1989)CrossRefGoogle Scholar
  3. 3.
    J. Hartikainen, Rev. Sci. Instr. (to be published)Google Scholar
  4. 4.
    J. Hartikainen, J. Jaarinen and M. Luukkala, in Review of Progress in Quantitative Nonde wctive Evaluation, edited by D.O. Thompson and D.E. Chimenti ( Plenum Press, New York, 1989 ), Vol. 8B, pp. 1321–1328Google Scholar
  5. 5.
    J. Hartikainen, Appl. Phys. Lett. (to be published)Google Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • Jari Hartikainen
    • 1
  1. 1.Department of PhysicsUniversity of HelsinkiHelsinkiFinland

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