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On a High Resolution Ultrasonic Inspection System

  • C. H. Chen
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

With increased demand for higher resolution ultrasonic evaluation, computer-based systems or workstations now become essential. In this paper a typical high resolution ultrasonic inspection system is presented. HIRUSIS, an mnemonic for HIgh Resolution UltraSonic Inspection System, is developed primarily for the purpose of high performance hidden flaw characterization and feature-based classification. The basic system comprises a PC (Personal Computer), a Pulser/Receiver and a Digital Oscilloscope as shown in Fig. 1. The system is further supported by several customized software packages for remote control of the devices, signal acquisition and presentation, one-dimensional and multi-dimensional signal processing, pattern recognition and B-scan image reconstruction. More image processing softwares will be added in the near future.

Keywords

Digital Oscilloscope Window Data ASCII Format Army Material Technology Laboratory Interleave Sampling 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Information Research Lab., Inc., “IUNDE(TM) 2.0 User’s Manual”, 1989.Google Scholar
  2. 2.
    C. H. Chen and S. K. Sin, “Interactive ultrasonic nondestructive evaluation”, Report MTL TR 88–34, Contract DAAL04–88-C-0003, Oct. 1988.Google Scholar
  3. 3.
    Nestor, Inc., “NDS 1000 Reference Manual”, June 1988.Google Scholar
  4. 4.
    C. H. Chen, “High resolution spectral analysis NDE techniques for flaw characterization, prediction and discrimination”, in Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials edited by C. H. Chen (Springer-Verlag Berlin Heidelberg, 1988 ), pp. 155–173.Google Scholar
  5. 5.
    C. H. Chen, “A comparison of deconvolution techniques for ultrasonic NDE”, to appear in Journal of Imaging Systems and Technology, 1989.Google Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • C. H. Chen
    • 1
  1. 1.Information Research Laboratory, Inc.N. DartmouthUSA

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