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High Frequency-High Temperature Ultrasonic Transducers

  • N. D. Patel
  • S. X. Fulford
  • P. S. Nicholson
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series

Abstract

Ultrasonic testing is a promising NDE technique for ceramic structural components. The lifetime of such components is controlled by defects and flaws. The critical flaw sizes for high performance ceramics are 25 µm and to detect such small flaws, the frequency of the transducers has to be >30 MHz [1–4]. Such transducers are usually made from ZnO, LiNbO3, LMN composites [5], and PVDF piezoelectric materials However there are no reports of aluminium nitride (AIN) films being used for such applications In this paper the piezoelectric and dielectric properties of A1N films and their application to high frequency devices are discussed and compared with the conventional materials.

Keywords

Piezoelectric Material Piezoelectric Property Critical Flaw Size Aluminium Nitride High Frequency Transducer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    N.D. Patel, J. Van Den Andel and P.S. Nicholson, Review of Progress in Quantitative Nondestructive Evaluation, Vol 7A, D.O.Thompson and D. E. Chimenti (Plenum Press, New York), pp 662, 1988.Google Scholar
  2. 2.
    N.D. Patel and P.S. Nicholson, Review of Progress in Quantitative Nondestructive Evaluation, Vol 8A, pp 873, 1989.CrossRefGoogle Scholar
  3. 3.
    A. Stockman, P. Mathieu and P.S. Nicholson, Materials Evaluation, 47 (3) pp 356, 1989.Google Scholar
  4. 4.
    Y.T. Khuri-Yakub, G.S. Kino, Y. Shui, D.B. Marshall and A.G. Evans, Review of Progress in QNDE, Edited by D O. Thompson and D.E. Chimenti ( Plenum Press, New York ), 1983.Google Scholar
  5. 5.
    N.D. Patel and P.S. Nicholson, Submitted to Ultrasonic International 86 — Conference Proceedings, held in Madrid, Spain, 1989.Google Scholar
  6. 6.
    N.D. Patel, P.H. Boldt and P.S. Nicholson, Submitted to Thick and Thin Film Symposium, The American Ceramic Society, 1989.Google Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • N. D. Patel
    • 1
  • S. X. Fulford
    • 1
  • P. S. Nicholson
    • 1
  1. 1.Ceramic Research GroupMcMaster UniversityHamiltonCanada

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