Adatom Site Determination using Channeling Effects in RHEED on X-ray and Auger Electron Production
In recent years, several authors have discussed the effects of variations in diffraction conditions in Reflection High Energy Electron Diffraction (RHEED) on Auger electron or characteristic X-ray emission. Ichimiya and Takeuchi  in particular have recently observed a strong enhancement of the Auger electron production at the surface wave resonance (SWR) condition, in experiments on MgO under Ultra-high Vacuum (UHV) conditions. “Monolayer resonances” which increase the intensity of Bragg beams by as much as 100, have also been analyzed in Pt(111) by Marten and Meyer-Ehmsen . A related theoretical and experimental study of Auger and backscattered electron production for low energy electrons (E < 2 kV) incident at near-normal incidence on bulk samples has also been given [3,4]. (Here many Bloch waves are excited, unlike the reflection case.) Experimental observations of channelling effects on backscattered electron production, and their uses to provide image contrast in a UHV scanning reflection electron microscope have also been reported . For a recent analysis of the diffraction conditions required to excite the surface wave resonance condition, the reader is referred to the work of Ichimiya, Kambe and Lehumpfuhl . Channeling effects on characteristic X-ray production in RHEED are further analyzed in Miyake and Hayakawa .
KeywordsAuger Electron Reflection High Energy Electron Diffraction Secondary Emission Diffraction Condition Reflection High Energy Electron Diffraction Pattern
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